|
CNS |
|
General No. |
CNS 13781 |
| Classified No. |
C6376 |
Endurance Testing Methods for Infrared Emitting Diodes (for Automation)-Burn-In Test (Forward Bias)
自動控制用紅外發光二極體耐久性試驗法–預燒試驗（順向偏壓） |
Date of Approval
|
Bureau of Standards,
Metrology and Inspection |
Date of
Revision
|
|
|
Thanks for your interest in
"CNS 13781" standard !
This CNS Standard is not ready translated, only after get your order, then we translate it, time usually need more 3-5 days !
|
 |
| CNS
Standard Code |
CNS 13781:2017 |
| CNS Standard Classified No. |
C6376 |
|
CNS Standard English Title |
Endurance Testing Methods for Infrared Emitting Diodes (for Automation)-Burn-In Test (Forward Bias) |
|
CNS Standard Chinese Title |
自動控制用紅外發光二極體耐久性試驗法–預燒試驗（順向偏壓） |
|
CNS Standard Edition |
Status：Current; Latest date：10/30/1996 Confirmed date：09/12/2017 |
|
CNS Standard Pages |
3 |
| Chinese Version Price |
$*** |
| English Translation Price |
$***
USD |
|
Sale Price |
Inquire us for detail price
|
Relevant CNS Standards about CNS 13781 >>>
|
+86-755-25831330
