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	CNS 15748-4 - English Version Integrated circuits – Measurement of electromagnetic emissions, 150 kHz to 1 GHz – Part 4: Measurement of conducted emissions – 1 Ω/150 Ω direct coupling method 積體電路－150 kHz 至1 GHz 電磁放射量測－第4 部：傳導放射量測－1Ω/150Ω直接耦合法積體電路－150 kHz 至1 GHz 電磁放射量測－第4 部：傳導放射量測－1Ω/150Ω直接耦合法 - 英文版
	CNS 15748-5 - English Version Integrated circuits – Measurement of electromagnetic emissions, 150 kHz to 1 GHz – Part 5: Measurement of conducted emissions – Workbench Faraday Cage method 積體電路－150 kHz 至1 GHz 電磁放射量測－第5 部：傳導放射量測－工作台法拉第箱體法 - 英文版
	CNS 15748-6 - English Version Integrated circuits – Measurement of electromagnetic emissions, 150 kHz to 1 GHz – Part 6: Measurement of conducted emissions – Magnetic probe method 積體電路－150 kHz 至1 GHz 電磁放射量測－第6 部：傳導放射量測－磁場探棒法 - 英文版
	CNS 15811-4 - English Version Integrated circuits − Measurement of electromagnetic immunity − 150 kHz to 1 GHz − Part 4: Direct RF power injection method 積體電路－ 150 kHz 至1 GHz 電磁抗擾度量測－第4 部：射頻功率直接注入法 - 英文版
	CNS 15748-3 - English Version Integrated circuits − Measurement of electromagnetic emissions, 150 kHz to 1 GHz – Part 3: Measurement of radiated emissions – Surface scan method 積體電路－150 kHz 至1 GHz 電磁放射量測－第3 部：輻射放射量測－表面掃描法 - 英文版
	CNS 15811-5 - English Version Integrated circuits – Measurement of electromagnetic immunity − 150 kHz to 1 GHz − Part 5: Workbench Faraday cage method 積體電路－ 150 kHz 至1 GHz 電磁抗擾度量測－第5 部：工作台法拉第箱體法 - 英文版
	CNS 15748-2 - English Version Integrated circuits – Measurement of electromagnetic emissions, 150 kHz to 1 GHz − Part 2: Measurement of radiated emissions − TEM cell and wideband TEM cell method 積體電路－ 150 kHz 至1 GHz 電磁放射量測－第2 部：輻射放射量測－橫向電磁波室與寬頻橫向電磁波室法 - 英文版
	CNS 15811-3 - English Version Integrated circuits – Measurement of electromagnetic immunity − 150 kHz to 1 GHz – Part 3: Bulk current injection (BCI) method 積體電路－150 kHz 至1 GHz 電磁抗擾度量測－第3 部：大電流注入法 - 英文版
	CNS 15748-1 - English Version Integrated circuits − Measurement of electromagnetic emissions, 150 kHz to 1 GHz − Part 1: General conditions and definitions 積體電路－150 kHz 至1 GHz 電磁放射量測－第1 部：一般條件及定義 - 英文版
	CNS 15811-2 - English Version Integrated circuits − Measurement of electromagnetic immunity − 150 kHz to 1 GHz − Part 2: Measurement of radiated immunity − TEM cell and wideband TEM cell method 積體電路－150 kHz 至1 GHz 電磁抗擾度量測－第2 部：輻射抗擾度量測－橫向電磁波室與寬頻橫向電磁波室法 - 英文版
	CNS 15811-5 - English Version Integrated circuits – Measurement of electromagnetic immunity − 150 kHz to 1 GHz − Part 5: Workbench Faraday cage method 積體電路－150 kHz至1 GHz電磁抗擾度量測－第5部：工作台法拉第箱體法 - 英文版
	CNS 15811-4 - English Version Integrated circuits − Measurement of electromagnetic immunity − 150 kHz to 1 GHz − Part 4: Direct RF power injection method 積體電路－150 kHz至1 GHz電磁抗擾度量測－第4部：射頻功率直接注入法 - 英文版
	CNS 15811-3 - English Version Integrated circuits – Measurement of electromagnetic immunity − 150 kHz to 1 GHz – Part 3: Bulk current injection (BCI) method 積體電路－150 kHz至1 GHz電磁抗擾度量測－第3部：大電流注入法 - 英文版
	CNS 15811-2 - English Version Integrated circuits − Measurement of electromagnetic immunity − 150 kHz to 1 GHz − Part 2: Measurement of radiated immunity − TEM cell and wideband TEM cell method 積體電路－150 kHz至1 GHz電磁抗擾度量測－第2部：輻射抗擾度量測－橫向電磁波室與寬頻橫向電磁波室法 - 英文版
	CNS 15748-6 - English Version Integrated circuits – Measurement of electromagnetic emissions, 150 kHz to 1 GHz – Part 6: Measurement of conducted emissions – Magnetic probe method 積體電路－150 kHz至1 GHz電磁放射量測－第6部：傳導放射量測－磁場探棒法 - 英文版

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