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    CNS 13623 - English Version
    Test Methods for Measuring Resistivity,Hall Coefficient and Determining Hall Mobility in Single-Crystal Semiconductors(Van Der Pauw Method)
    單晶片之電阻率、霍爾係數及霍爾移動率之測定法(范德普法) - 英文版

    CNS 13624 - English Version
    Test Methods for Crystallographic Perfection of Gallium Arsenside by Molten Potassium Hydroxide(KOH)Etch Technique
    砷化鎵晶體結晶完整性檢驗法(熔融氫氧化鉀浸蝕法) - 英文版

    CNS 13624 - English Version
    Test Methods for Crystallographic Perfection of Gallium Arsenside by Molten Potassium Hydroxide(KOH)Etch Technique
    砷化鎵晶體結晶完整性檢驗法(熔融氫氧化鉀浸蝕法) - 英文版

    CNS 13623 - English Version
    Test Methods for Measuring Resistivity,Hall Coefficient and Determining Hall Mobility in Single-Crystal Semiconductors(Van Der Pauw Method)
    單晶片之電阻率、霍爾係數及霍爾移動率之測定法(范德普法) - 英文版


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