China 'SJ/T 2658.9-2015
' standard english version summary:
SJ
中华人民共和国行业标准
INDUSTRY STANDARD OF THE PEOPLE'S REPUBLIC OF CHINA
SJ/T 2658.9-2015
Measuring method for semiconductor infrared-emitting diode - Part 9: Spatial distribution of radiant intensity and half-intensity angle 半导体红外发射二极管测量方法 第9部分:辐射强度空间分布和半强度角
Issued Date:
Implemented Date:
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The Standardization Administration of the People's Republic of China
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"SJ/T 2658.9-2015" standard !
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Measuring method for semiconductor infrared-emitting diode - Part 9: Spatial distribution of radiant intensity and half-intensity angle
GB Standard Chinese Title
半导体红外发射二极管测量方法 第9部分:辐射强度空间分布和半强度角
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