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    SJ/T 11492-2015 Test methods for measurement of composition of gallium arsenide phosphide wafers by photoluminescence

    China Electronics - SJ Standards

    SJ/T 11491-2015 Test methods for measurement of interstitial oxygen content in silicon by short baseline infrared absorption spectrometry

    China Electronics - SJ Standards

    SJ/T 11490-2015 Test method for measuring etch pit density (EPD) in low dislocation density gallium arsenide wafers

    China Electronics - SJ Standards

    SJ/T 11489-2015 Test method for measuring etch pit density (EPD) in low dislocation density indium phosphide wafers

    China Electronics - SJ Standards

    SJ/T 11488-2015 Test method for measuring resistivity, hall coefficient and determining hall mobility in semi-insulating GaAs single crystals

    China Electronics - SJ Standards

    SJ/T 11487-2015 Non-contact measurement method for the resistivity of semi-insulating semiconductor wafer

    China Electronics - SJ Standards

    SJ/T 11486-2015 Technical specification for low power light. emitting diode chips

    China Electronics - SJ Standards

    SJ/T 11485-2015 LED type naming rules

    China Electronics - SJ Standards

    SJ/T 11484-2015 Aluminum doped zinc oxide type transparent conductive oxide coated glass

    China Electronics - SJ Standards

    SJ/T 11460.6.2-2015 Backlight unit for liquid crystal display. Part 6-2:Measuring methods of dynamic optical and optoelectrical parameters

    China Electronics - SJ Standards

    SJ/T 11460.6.1-2015 Backlight unit for liquid crystal display. Part 6-1:Measuring method of optical and optoelectrical parameters

    China Electronics - SJ Standards

    SJ/T 11378.7-2015 (Plasma display panels - Part 7: Digital TV with the reliability of the test method for plasma display)

    China Electronics - SJ Standards

    SJ/T 11378.6.1-2015 (Plasma display panels - Part 6-1: Digital TV color plasma display detailed specification)

    China Electronics - SJ Standards

    SJ/T 11340-2015 (General specification front projector)

    China Electronics - SJ Standards

    SJ/T 11310.6-2015 Information device intelligent grouping and resource sharing. Part 6:Service type

    China Electronics - SJ Standards

    SJ/T 11310.5-2015 Information device intelligent grouping and resource sharing. Part 5:Device type

    China Electronics - SJ Standards

    SJ/T 11310.3-2015 (Information Equipment Resource Sharing Services Part 3: Basic application)

    China Electronics - SJ Standards

    SJ/T 11310.2-2015 Information device intelligent grouping and resource sharing. Part 2:Application profile

    China Electronics - SJ Standards

    SJ/T 10465-2015 Metallized polyester film for capacitors

    China Electronics - SJ Standards

    SJ/T 10464-2015 Metallized polypropylene film for capacitors

    China Electronics - SJ Standards

    SJ/T 11246-2014 (Effective ceramic shell vacuum switch)

    China Electronics - SJ Standards

    SJ/T 11050-2014 (Multilayer Printed epoxy prepreg fiberglass cloth adhesive sheet)

    China Electronics - SJ Standards

    SJ/T 10647-2014 Detail specification for bar electrical connectors, type TJC6

    China Electronics - SJ Standards

    SJ/T 10646-2014 Detail specification for bar electrical connectors, type TJC4

    China Electronics - SJ Standards

    SJ/T 10645-2014 Detail specification for bar electrical connectors, type, TJC3

    China Electronics - SJ Standards

    SJ/T 10644-2014 Detail specification for bar electrical connectors, type, TJC2

    China Electronics - SJ Standards

    SJ/T 10643-2014 Detail specification for bar electrical connectors, type, TJC1

    China Electronics - SJ Standards

    SJ/T 10642-2014 General specification for bar electrical connectors, type TJC

    China Electronics - SJ Standards

    SJ/T 2217-2014 (Silicon phototransistor technical specifications)

    China Electronics - SJ Standards

    SJ/T 1563-2014 Coaxial radio-frequency cables with solid polytetrafluoroethylene (PTFE) insulation

    China Electronics - SJ Standards


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