China 'SJ/T 2658.9-2015
' Industry standard english version:
SJ
中华人民共和国行业标准
INDUSTRY STANDARD OF THE PEOPLE'S REPUBLIC OF CHINA
SJ/T 2658.9-2015
Measuring method for semiconductor infrared-emitting diode - Part 9: Spatial distribution of radiant intensity and half-intensity angle 半导体红外发射二极管测量方法 第9部分:辐射强度空间分布和半强度角
Issued Date:2015-10-10
Implemented Date:2016-04-01
Issued by:
The Standardization Administration of the People's Republic of China
GB Standard Code
SJ/T 2658.9-2015
Standard Category
China Electronics
Standards
GB Standard English Title
Measuring method for semiconductor infrared-emitting diode - Part 9: Spatial distribution of radiant intensity and half-intensity angle