GB/T 14849.4-2014
China national
standard english version:
GB
中华人民共和国国家标准
NATIONAL
STANDARD OF THE PEOPLE'S REPUBLIC OF CHINA
GB/T 14849.4-2014
Methods for chemical analysis of silicon metal―Part 4:Determination of impurity contents―Inductively coupled plasma atomic emission spectrometric method 工业硅化学分析方法 第4部分:杂质元素含量的测定 电感耦合等离子体原子发射光谱法
Issued Date:2014-12-05
Implemented Date:2015-08-01
Issued by:
The Standardization Administration of the People's Republic of China