GB/T 32651-2016
China national
standard english version:
GB
中华人民共和国国家标准
NATIONAL
STANDARD OF THE PEOPLE'S REPUBLIC OF CHINA
GB/T 32651-2016
Test method for measuring trace elements in photovoltaic-grade silicon by high-mass resolution glow discharge mass spectrometry 采用高质量分辨率辉光放电质谱法测量太阳能级硅中痕量元素的测试方法
Issued Date:2016-04-25
Implemented Date:2016-11-01
Issued by:
The Standardization Administration of the People's Republic of China