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| Standard Code | Standard Title | Standard Class | Order |
|---|---|---|---|
| GB/T 35007-2018 |
Semiconductor integrated circuits—Measuring method of low voltage differential signaling circuitry 半导体集成电路 低电压差分信号电路测试方法 |
China National Standards circuits—Measuring |
 English PDF |
| GB/T 35006-2018 |
Semiconductor integrated circuits—Measuring method of level converter 半导体集成电路 电平转换器测试方法 |
China National Standards circuits—Measuring |
English PDF |
| GB/T 35002-2018 |
Microwave circuits—Measuring methods for frequency source 微波电路 频率源测试方法 |
China National Standards circuits—Measuring |
English PDF |
| GB/T 35001-2018 |
Microwave circuits—Measuring methoels for noise source 微波电路 噪声源测试方法 |
China National Standards circuits—Measuring |
English PDF |
| GB/T 35011-2018 |
Microwave circuits—Measuring methods for voltage controlled oscillater 微波电路 压控振荡器测试方法 |
China National Standards circuits—Measuring |
English PDF |
| GB/T 14028-2018 |
Semiconductor integrated circuits—Measuring method of analogue switch 半导体集成电路 模拟开关测试方法 |
China National Standards circuits—Measuring |
English PDF |
| GB/T 4377-2018 |
Semiconductor integrated circuits—Measuring method of voltage regulators 半导体集成电路 电压调整器测试方法 |
China National Standards circuits—Measuring |
English PDF |
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