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| Standard Code | Standard Title | Standard Class | Order |
|---|---|---|---|
| GB/T 43661-2024 |
Surface chemical analysis - Scanning probe microscopy - Definition and calibration of spatial resolution of electrical scanning probe microscopes (ESPM, such as SSRM and SCM) for two-dimensional imaging of dopants, etc. {译} 表面化学分析-扫描探针显微术-用于二维掺杂物成像等用途的电扫描探针显微镜（ESPM，如SSRM和SCM）空间分辨的定义和校准 |
China National Standards dopant |
 English PDF |
| GB/T 13389-2014 |
Practice for conversion between resistivity and dopant density for boron-doped, phosphorus-doped, and arsenic-doped silicon 掺硼掺磷掺砷硅单晶电阻率与掺杂剂浓度换算规程 |
China National Standards dopant |
English PDF |
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