Standard Code | Standard Title | Standard Class | Order |
---|---|---|---|
GB/T 42676-2023 |
Testing the quality of Semiconductor single crystals X-ray diffraction method {译} 半导体单晶晶体质量的测试 X射线衍射法 |
China National Standards Semiconductor single crystal |
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GB/T 1555-2023 |
Semiconductor single crystal crystal orientation determination method {译} 半导体单晶晶向测定方法 |
China National Standards Semiconductor single crystal |
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GB/T 1555-2009 |
Testing methods for determining the orientation of a Semiconductor single crystal 半导体单晶晶向测定方法 |
China National Standards Semiconductor single crystal |
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GB/T 4326-2006 |
Extrinsic Semiconductor single crystals measurement of Hall mobility and Hall coefficient 非本征半导体单晶霍尔迁移率和霍尔系数测量方法 |
China National Standards Semiconductor single crystal |
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