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| Standard Code | Standard Title | Standard Class | Order |
|---|---|---|---|
| GB/T 30118-2013 |
Single crystal wafers for surface acoustic wave (SAW) device applications―Specifications and measuring methods 声表面波（SAW）器件用单晶晶片规范与测量方法 |
China National Standards Single crystal wafers |
 English PDF |
| GB/T 13388-2009 |
Method for measuring crystallographic orientation of flats on single-crystal silicon slices and wafers by X-ray techniques 硅片参考面结晶学取向X射线测试方法 |
China National Standards Single crystal wafers |
English PDF |
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