Standard Code | Standard Title | Standard Class | Order |
---|---|---|---|
GB/T 1551-2009 |
Test method for measuring resistivity of monoCrystal silicon 硅单晶电阻率测定方法 |
China National Standards Crystal |
English PDF |
GB/T 13388-2009 |
Method for measuring Crystallographic orientation of flats on single-crystal silicon slices and wafers by X-ray techniques 硅片参考面结晶学取向X射线测试方法 |
China National Standards Crystal |
English PDF |
GB/T 11072-2009 |
Indium antimonide polyCrystal,single crystals and as-cut slices 锑化铟多晶、单晶及切割片 |
China National Standards Crystal |
English PDF |
GB/T 9649.9-2009 |
Terminology classification and code of geology and mineral resources - Part 9: Crystallography and mineralogy 地质矿产术语分类代码 第9部分:结晶学及矿物学 |
China National Standards Crystal |
English PDF |
GB/T 24370-2009 |
Characterization of CdSe quantum dot nanoCrystals - UV-Vis absorption spectroscopy 硒化镉量子点纳米晶体表征 紫外-可见吸收光谱方法 |
China National Standards Crystal |
English PDF |
GB/T 3710-2009 |
Method of determination for Crystallizing point of technical phenol and phenic acid 工业酚、苯酚结晶点测定方法 |
China National Standards Crystal |
English PDF |
GB/T 24206-2009 |
Determination of Crystallized matter at 15℃ of washing oil 洗油15℃结晶物的测定方法 |
China National Standards Crystal |
English PDF |
GB/T 13255.2-2009 |
Test methods of caprolactam for industrial use - Part 2: Determination of Crystallizing point 工业用己内酰胺试验方法 第2部分:结晶点的测定 |
China National Standards Crystal |
English PDF |
GB/T 23413-2009 |
Determination of Crystallite size and micro-strain of nano-materials - X-ray diffraction line broadening method 纳米材料晶粒尺寸及微观应变的测定 X射线衍射线宽化法 |
China National Standards Crystal |
English PDF |
GB/T 22780-2008 |
Liquid Crystal displaying quartz watches 液晶式石英手表 |
China National Standards Crystal |
English PDF |
GB/T 22779-2008 |
Liquid Crystal displaying quartz clocks 液晶式石英钟 |
China National Standards Crystal |
English PDF |
GB/T 22778-2008 |
Liquid Crystal digital quartz stopwatches 液晶数字式石英秒表 |
China National Standards Crystal |
English PDF |
GB/T 22453-2008 |
Non-linear optical borate Crystal devices measuring method 硼酸盐非线性光学单晶元件质量测试方法 |
China National Standards Crystal |
English PDF |
GB/T 22452-2008 |
General technical condition of non-linear optical borate Crystal devices 硼酸盐非线性光学单晶元件通用技术条件 |
China National Standards Crystal |
English PDF |
GB/T 22319.8-2008 |
Measurement of quartz Crystal unit parameters - Part 8: Test fixture for surface mounted quartz crystal units 石英晶体元件参数的测量 第8部分:表面贴装石英晶体元件用测量夹具 |
China National Standards Crystal |
English PDF |
GB/T 16582-2008 |
Plastics - Determination of melting behaviour (melting temperature or melting range) of semi-Crystalline polymers by capillary tube and polarizing-microscope methods 塑料 用毛细管法和偏光显微镜法测定部分结晶聚合物熔融行为(熔融温度或熔融范围) |
China National Standards Crystal |
English PDF |
GB/T 7896-2008 |
Test method for optical grade synthetic quartz Crystal 人造光学石英晶体试验方法 |
China National Standards Crystal |
English PDF |
GB/T 7895-2008 |
Optical grade synthetic quartz Crystal 人造光学石英晶体 |
China National Standards Crystal |
English PDF |
GB/T 18910.41-2008 |
Liquid Crystal display devices Part 4-1: Matrix colour LCD modules- Essential ratings and characteristics 液晶显示器件 第4-1部分:彩色矩阵液晶显示模块 基本额定值和特性 |
China National Standards Crystal |
English PDF |
GB/T 18910.22-2008 |
Liquid Crystal display devices Part 2-2: Matrix colour LCD modules-Blank detail specification 液晶显示器件 第2-2部分:彩色矩阵液晶显示模块 空白详细规范 |
China National Standards Crystal |
English PDF |
GB 22160-2008 |
Food grade microCrystalline wax 食品级微晶蜡 |
China National Standards Crystal |
English PDF |
GB/T 18910.5-2008 |
Liquid Crystal and solid-state display devices - Part 5:Environmental,endurance and mechanical test methods 液晶和固态显示器件 第5部分:环境、耐久性和机械试验方法 |
China National Standards Crystal |
English PDF |
GB/T 18910.3-2008 |
Liquid Crystal and solid-state display devices - Part 3: Sectional specification for liquid crystal display (LCD) cells 液晶和固态显示器件 第3部分: 液晶显示屏分规范 |
China National Standards Crystal |
English PDF |
GB/T 21952-2008 |
PolyCrystalline diamond inserts,tipped - Dimensions 镶聚晶金刚石刀片 尺寸 |
China National Standards Crystal |
English PDF |
GB/T 19421-2008 |
Test methods of Crystalline layered sodium disilicate 层状结晶二硅酸钠试验方法 |
China National Standards Crystal |
English PDF |
GB/T 12832-2008 |
Rubber-Determination of Crystallization effects by hardness measurements 橡胶结晶效应的测定 硬度测量法 |
China National Standards Crystal |
English PDF |
GB/T 2385-2007 |
Dyes intermediates - General method for the determination of Crystallizing point 染料中间体 结晶点的测定通用方法 |
China National Standards Crystal |
English PDF |
GB/T 4060-2007 |
PolyCrystalline silicon - examination method - vacuum zone - melting on boron 硅多晶真空区熔基硼检验方法 |
China National Standards Crystal |
English PDF |
GB/T 4059-2007 |
PolyCrystalline silicon - examination method - zone - melting on phosphorus under controlled atomosphere 硅多晶气氛区熔基磷检验方法 |
China National Standards Crystal |
English PDF |
GB/T 11094-2007 |
Horizontal bridgman grown gallium arsenide single Crystal and cutting wafer 水平法砷化镓单晶及切割片 |
China National Standards Crystal |
English PDF |
GB/T 11093-2007 |
Liquid encapsulated czochralski - grown gallium arsenide single Crystals and as-cut slices 液封直拉法砷化镓单晶及切割片 |
China National Standards Crystal |
English PDF |
GB/T 18910.4-2007 |
Liquid Crystal and solid-state display devices - Part 4: Liquid crystal display modules and cells - Essential ratings and characteristics 液晶和固态显示器件 第4部分:液晶显示模块和屏 基本额定值和特性 |
China National Standards Crystal |
English PDF |
GB/T 18910.21-2007 |
Liquid Crystal and solid-state display devices - part 2-1: Passive matrix monochrome LCD modules - Blank detail specification 液晶和固态显示器件 第2-1部分:无源矩阵单色液晶显示模块 空白详细规范 |
China National Standards Crystal |
English PDF |
GB/T 20724-2006 |
Method of thickness measurement for thin Crystal by convergent beam electron diffraction 薄晶体厚度的会聚束电子衍射测定方法 |
China National Standards Crystal |
English PDF |
GB/T 618-2006 |
Chemical reagent - General method for the determination of Crystallizing point 化学试剂 结晶点测定通用方法 |
China National Standards Crystal |
English PDF |
GB/T 8760-2006 |
Gallium arsenide single Crystal-determination of dislocation density 砷化镓单晶位错密度的测量方法 |
China National Standards Crystal |
English PDF |
GB/T 5252-2006 |
Germanium monoCrystal - inspection of dislocation etch pit density 锗单晶位错腐蚀坑密度测量方法 |
China National Standards Crystal |
English PDF |
GB/T 4326-2006 |
Extrinsic semiconductor single Crystals measurement of Hall mobility and Hall coefficient 非本征半导体单晶霍尔迁移率和霍尔系数测量方法 |
China National Standards Crystal |
English PDF |
GB/T 20230-2006 |
Indium phosphide single Crystal 磷化铟单晶 |
China National Standards Crystal |
English PDF |
GB/T 20229-2006 |
Gallium phosphide single Crystal 磷化镓单晶 |
China National Standards Crystal |
English PDF |
GB/T 20228-2006 |
Gallium arsenide single Crystal 砷化镓单晶 |
China National Standards Crystal |
English PDF |
GB/T 20214-2006 |
Crystalline layered sodium disilicate 层状结晶二硅酸钠 |
China National Standards Crystal |
English PDF |
GB/T 12965-2005 |
MonoCrystalline silicon as cut slices and lapped slices 硅单晶切割片和研磨片 |
China National Standards Crystal |
English PDF |
GB/T 12962-2005 |
MonocCrystalline silicon 硅单晶 |
China National Standards Crystal |
English PDF |
GB/T 19857-2005 |
Determination of malachite green and Crystal violet residues in aquatic product 水产品中孔雀石绿和结晶紫残留量的测定 |
China National Standards Crystal |
English PDF |
GB/T 3069.2-2005 |
Method for the determination of The Crystallization temperature of naphthalene 萘结晶点的测定方法 |
China National Standards Crystal |
English PDF |
GB/T 19466.3-2004 |
Plastics--Differential scanning calorimetry(DSC)--Part 3:Determination of temperatureand enthalpy of melting and Crystallization 塑料 差示扫描量热法(DSC) 第3部分:熔融和结晶温度及热焓的测定 |
China National Standards Crystal |
English PDF |
GB/T 18910.2-2003 |
Liquid Crystal and solid-state display devices--Part 2:Liquid crystal display modules sectional specification 液晶和固态显示器件 第2部分:液晶显示模块分规范 |
China National Standards Crystal |
English PDF |
GB/T 19346-2003 |
Measuring method of magnetic properties at alternative current for amorphous and nanoCrystalline soft magnetic alloys 非晶纳米晶软磁合金交流磁性能测试方法 |
China National Standards Crystal |
English PDF |
GB/T 19345-2003 |
Amorphous and nanoCrystalline soft magnetic alloy strips 非晶、纳米晶软磁合金带材 |
China National Standards Crystal |
English PDF |
GB/T 19199-2003 |
Test method for carbon concentration of semi-insulating monoCrystal gallium arsenide by measurement infrared absorption method 半绝缘砷化镓单晶中碳浓度的红外吸收测试方法 |
China National Standards Crystal |
English PDF |
GB/T 12964-2003 |
MonoCrystalline silicon polished wafers 硅单晶抛光片 |
China National Standards Crystal |
English PDF |
GB/T 18680-2002 |
The transparent conductive glass withindium-tin oxide films used in liquid Crystal display 液晶显示器用氧化铟锡透明导电玻璃 |
China National Standards Crystal |
English PDF |
GB 9558-2001 |
Crystallo-dimethoate 晶体乐果 |
China National Standards Crystal |
English PDF |
GB/T 18210-2000 |
Crystalline silicon photovoltaic(PV) array--On-site measurement of I-V characteristics 晶体硅光伏(PV)方阵 I-V特性的现场测量 |
China National Standards Crystal |
English PDF |
GB/T 18032-2000 |
The inspecting method of AB microscopic defect in gallium arsenide single Crystal 砷化镓单晶AB微缺陷检验方法 |
China National Standards Crystal |
English PDF |
GB/T 17669.2-1999 |
Gypsum plasters--Determination of water of Crystallization content 建筑石膏 结晶水含量的测定 |
China National Standards Crystal |
English PDF |
GB/T 9535-1998 |
Crystalline silicon terrestrial photovoltaic (PV) modules-design qualification and type approval 地面用晶体硅光伏组件 设计鉴定和定型 |
China National Standards Crystal |
English PDF |
GB/T 17170-1997 |
Test method for deep level EL2 concentration of undoped semiinsulating monoCrystal gallium arsenide by measurement infra-red absorption method 非掺杂半绝缘砷化镓单晶深能级EL2浓度红外吸收测试方法 |
China National Standards Crystal |
English PDF |
GB/T 16864-1997 |
Method for testing cryogenic transmissivityof Crystals 低温下晶体透射率的试验方法 |
China National Standards Crystal |
English PDF |
GB/T 16863-1997 |
Method for testing refractive index of Crystals 晶体折射率的试验方法 |
China National Standards Crystal |
English PDF |
GB/T 16822-1997 |
Test method for dielectric properties of dielectric Crystal 介电晶体介电性能的试验方法 |
China National Standards Crystal |
English PDF |
GB/T 16517-1996 |
Quartz Crystal units--A specification in the quality assessment system for electronic components--Part 3:Sectional specification--Qualification approval 石英晶体元件 电子元器件质量评定体系规范 第3部分:分规范 鉴定批准 |
China National Standards Crystal |
English PDF |
GB/T 12273-1996 |
Quartz Crystal units--A specification in the quality assessment system for electronic components--Part 1:Generic specification 石英晶体元件 电子元器件质量评定体系规范 第1部分:总规范 |
China National Standards Crystal |
English PDF |
GB/T 16516-1996 |
Quartz Crystal units--A specification in the quality assessment system for electronic components--Part 2:Sectional specification--Capability approval 石英晶体元件 电子元器件质量评定体系规范 第2部分:分规范 能力批准 |
China National Standards Crystal |
English PDF |
GB/T 6495.4-1996 |
Procedures for temperature and irradiance corrections to measured I-V characteristics of Crystalline silicon photovoltaic devices 晶体硅光伏器件的I-V实测特性的温度和辐照度修正方法 |
China National Standards Crystal |
English PDF |
GB/T 7533-1993 |
Determination for Crystallizing point of organic chemical products for industrial use 有机化工产品结晶点的测定方法 |
China National Standards Crystal |
English PDF |
GB/T 14142-1993 |
Test method for Crystallographic perfection of epit-axial layers in silicon by etching techniques 硅外延层晶体完整性检查方法 腐蚀法 |
China National Standards Crystal |
English PDF |
GB/T 14077-1993 |
Measurement specification for birefractance Crystal and polarizer 双折射晶体和偏振器件测试规范 |
China National Standards Crystal |
English PDF |
GB/T 13843-1992 |
Polished monoCrystalline sapphire substrates 蓝宝石单晶抛光衬底片 |
China National Standards Crystal |
English PDF |
GB/T 12634-1990 |
Test methods for electroelastic constants of piezoelectric Crystals 压电晶体电弹常数测试方法 |
China National Standards Crystal |
English PDF |
GB/T 12633-1990 |
Terms for the measurements of the properties of the piezoelectric Crystals 压电晶体性能测试术语 |
China National Standards Crystal |
English PDF |
GB/T 12275-1990 |
The rule of type designation for quartz Crystal oscillators 石英晶体振荡器型号命名方法 |
China National Standards Crystal |
English PDF |
GB/T 11114-1989 |
Method for detecting dislocationsof synthetic quartz Crystal using X-ray topographic technique 人造石英晶体位错的X 射线形貌检测方法 |
China National Standards Crystal |
English PDF |
GB/T 11113-1989 |
Analytical method for impurities in the synthetic quartz Crystal 人造石英晶体中杂质的分析方法 |
China National Standards Crystal |
English PDF |
GB/T 11312-1989 |
Test methods for SAW properties of piezoelectric ceramics and Crystals 压电陶瓷材料和压电晶体声表面波性能测试方法 |
China National Standards Crystal |
English PDF |
GB/T 11297.7-1989 |
Test method for resistivity and hall coefficient indium antimonide single Crystals 锑化铟单晶电阻率及霍耳系数的测试方法 |
China National Standards Crystal |
English PDF |
GB/T 11297.6-1989 |
Standard method for showing andmeasuring dislocation etch pits in indium antimonide single Crystal 锑化铟单晶位错蚀坑的腐蚀显示及测量方法 |
China National Standards Crystal |
English PDF |
GB/T 11295-1989 |
Designation for laser Crystal rods 激光晶体棒型号命名方法 |
China National Standards Crystal |
English PDF |
GB/T 8756-1988 |
Collection of metallographs on defects of Crystallinegermanium 锗晶体缺陷图谱 |
China National Standards Crystal |
English PDF |
GB/T 8553-1987 |
Holders (Enclosures), Crystal, General specification for 晶体盒总规范 |
China National Standards Crystal |
English PDF |
GB/T 6627-1986 |
Designations for lumbered synthetic quartz Crystals 人造石英晶体棒材型号命名方法 |
China National Standards Crystal |
English PDF |
GB/T 6430-1986 |
The rule of type designation for Crystal holders (enclosures) 晶体盒型号命名方法 |
China National Standards Crystal |
English PDF |
GB/T 6429-1986 |
The rule of type designation for quartz Crystalunits 石英谐振器型号命名方法 |
China National Standards Crystal |
English PDF |
GB/T 4702.9-1985 |
Methods for chemical analysis of chromium metal--The Crystal violet spectrophotometric method for the determination of antimony content 金属铬化学分析方法 结晶紫分光光度法测定锑量 |
China National Standards Crystal |
English PDF |
GB/T 3351-1982 |
Designations for synthetic quartz Crystals 人造石英晶体的型号命名 |
China National Standards Crystal |
English PDF |
GB/T 3145-1982 |
Benzene--Determination of Crystallizing point 苯结晶点测定法 |
China National Standards Crystal |
English PDF |
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