Standard Code | Standard Title | Standard Class | Order |
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GB/T 4023-1997 |
Semiconductor devices--Discrete devices and integrated circuits--Part 2:Rectifier diodes 半导体器件 分立器件和集成电路 第2部分:整流二极管 |
China National Standards Semiconductor |
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GB/T 17024-1997 |
Semiconductor devices--integratedcircuits--Part 2:Digital integrated circuits--Section three--Blank detail specification for HCMOS digital integrated circuits series 54/74HC,54/74HCT,54/74HCU 半导体器件 集成电路 第2部分:数字集成电路 第三篇 HCMOS数字集成电路54/74HC、54/74HCT、54/74HCU系列空白详细规范 |
China National Standards Semiconductor |
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GB/T 17023-1997 |
Semiconductor devices--Integrated circuits--Part 2:Digital integrated circuits--Section two--Family specification for HCMOS digital integrated circuits series 54/74HC,54/74HCT,54/74HCU 半导体器件 集成电路 第2部分:数字集成电路 第二篇 HCMOS数字集成电路54/74HC、54/74HCT、54/74HCU系列族规范 |
China National Standards Semiconductor |
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GB/T 6798-1996 |
Semiconductor integrated circuits--General principles of measuring methods of voltage comparators 半导体集成电路 电压比较器测试方法的基本原理 |
China National Standards Semiconductor |
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GB/T 4377-1996 |
Semiconductor integrated circuits--General principles of measuring methods of voltage regulator 半导体集成电路 电压调整器测试方法的基本原理 |
China National Standards Semiconductor |
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GB/T 3436-1996 |
Semiconductor integrated circuits--Series and products of operational amplifier 半导体集成电路 运算放大器系列和品种 |
China National Standards Semiconductor |
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GB/T 16464-1996 |
Semiconductor devices--Integrated circuits--Part 1:General 半导体器件 集成电路 第1部分:总则 |
China National Standards Semiconductor |
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GB/T 16438-1996 |
The safety demands of using Semiconductor lightning eliminator 半导体少长针消雷装置使用的安全要求 |
China National Standards Semiconductor |
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GB/T 15879-1995 |
Mechanical standardization of Semiconductor devices--Part 5:Recommendations applying to tape automated bonding (TAB) of integrated circuits 半导体器件的机械标准化 第5部分:用于集成电路载带自动焊(TAB)的推荐值 |
China National Standards Semiconductor |
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GB/T 15873-1995 |
Directives for drafting Semiconductor facilities interface specification 半导体设施接口技术文件编写导则 |
China National Standards Semiconductor |
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GB/T 6571-1995 |
Semiconductordevices--Discrete devices--Part 3:Signal(including switching)and regulator diodes 半导体器件 分立器件 第3部分:信号(包括开关)和调整二极管 |
China National Standards Semiconductor |
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GB/T 15653-1995 |
Measuring methods for gas sensors of metal-oxide Semiconductor 金属氧化物半导体气敏元件测试方法 |
China National Standards Semiconductor |
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GB/T 15652-1995 |
Generic specification for gas sensors of metal-oxide Semiconductor 金属氧化物半导体气敏元件总规范 |
China National Standards Semiconductor |
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GB/T 15651-1995 |
Semiconductor devices--Discrete devices and integrated circuits--Part 5:Optoelectronic devices 半导体器件 分立器件和集成电路 第5部分:光电子器件 |
China National Standards Semiconductor |
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GB/T 15649-1995 |
Blank detail specification for Semiconductor laser diodes 半导体激光二极管空白详细规范 |
China National Standards Semiconductor |
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GB/T 4587-1994 |
Semiconductor discrete devices and integrated circuits--Part 7:Bipolar transistors 半导体分立器件和集成电路 第7部分:双极型晶体管 |
China National Standards Semiconductor |
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GB/T 4586-1994 |
Semiconductor devices--Discrete devices--Part 8:Field-effect transistors 半导体器件 分立器件 第8部分:场效应晶体管 |
China National Standards Semiconductor |
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GB/T 15291-1994 |
Semiconductor devices--Part 6:Thyristors 半导体器件 第6部分 晶闸管 |
China National Standards Semiconductor |
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GB/T 15136-1994 |
General principles of measuring methods for quartz clock and watch circuits of Semiconductor integrated circuits 半导体集成电路石英钟表电路测试方法的基本原理 |
China National Standards Semiconductor |
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GB/T 2900.32-1994 |
Electrotechnical terminology--Power Semiconductor device 电工术语 电力半导体器件 |
China National Standards Semiconductor |
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GB/T 14862-1993 |
Junction-to-case thermal resistance test methods of packages for Semiconductor integrated circuits 半导体集成电路封装结到外壳热阻测试方法 |
China National Standards Semiconductor |
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GB/T 14844-1993 |
Designations of Semiconductor materials 半导体材料牌号表示方法 |
China National Standards Semiconductor |
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GB/T 14548-1993 |
General specification for marine Semiconductor convertors 船用半导体变流器通用技术条件 |
China National Standards Semiconductor |
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GB/T 14129-1993 |
Series and productsfor TTL Semiconductor integrated circuits--Products of series PAL 半导体集成电路TTL电路系列和品种 PAL系列的品种 |
China National Standards Semiconductor |
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GB/T 7092-1993 |
Outline dimensions of Semiconductor integratedcircuits 半导体集成电路外形尺寸 |
China National Standards Semiconductor |
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GB/T 14119-1993 |
Blankdetail specification for Semiconductor inte-grated circuit fusible-link programmable bipolar read-only memories 半导体集成电路双极熔丝式可编程只读存储器空白详细规范(可供认证用) |
China National Standards Semiconductor |
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GB/T 14115-1993 |
General principles of measuring methods of Sample/Hold amplifiers for Semiconductor integrated circuits 半导体集成电路采样/保持放大器测试方法的基本原理 |
China National Standards Semiconductor |
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GB/T 14114-1993 |
General principles of measuring methods of V/F and F/V converters for Semiconductor integrated circuits 半导体集成电路电压/频率和频率/电压转换器测试方法的基本原理 |
China National Standards Semiconductor |
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GB/T 14113-1993 |
Terminology of packages for Semiconductor inte-grated circuits 半导体集成电路封装术语 |
China National Standards Semiconductor |
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GB/T 14032-1992 |
General principles of measuring methods of digital phase-locked loop for Semiconductor integrated circuits 半导体集成电路数字锁相环测试方法的基本原理 |
China National Standards Semiconductor |
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GB/T 14031-1992 |
General principles of measuring methods of analogue phase-loop for Semiconductor integrated circuits 半导体集成电路模拟锁相环测试方法的基本原理 |
China National Standards Semiconductor |
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GB/T 14030-1992 |
General principles of measuring methods of timer circuits for Semiconductor integrated circuits 半导体集成电路时基电路测试方法的基本原理 |
China National Standards Semiconductor |
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GB/T 14029-1992 |
General principles of measuring methods of analogue multiplier for Semiconductor integrated circuits 半导体集成电路模拟乘法器测试方法的基本原理 |
China National Standards Semiconductor |
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GB/T 14028-1992 |
General principles of measuring methods of analogue switches for Semiconductor integrated circuits 半导体集成电路模拟开关测试方法的基本原理 |
China National Standards Semiconductor |
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GB/T 12565-1990 |
Semiconductor devices--Sectional specification for optoelectronic devices 半导体器件 光电子器件分规范 (可供认证用) |
China National Standards Semiconductor |
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GB/T 3430-1989 |
The rule of type designation for Semiconductor integrated circuits 半导体集成电路型号命名方法 |
China National Standards Semiconductor |
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GB/T 249-1989 |
The rule of type designation for discrete Semiconductor devices 半导体分立器件型号命名方法 |
China National Standards Semiconductor |
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GB/T 9425-1988 |
Blank detail specification for Semiconductor inte-grated circuit operational amplifiers 半导体集成电路运算放大器空白详细规范 (可供认证用) |
China National Standards Semiconductor |
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GB/T 7581-1987 |
Dimensions of outlines for Semiconductor discrete devices 半导体分立器件外形尺寸 |
China National Standards Semiconductor |
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GB/T 7509-1987 |
Blank detail specification for microprocessor Semiconductor integrated circuits 半导体集成电路微处理器空白详细规范 (可供认证用) |
China National Standards Semiconductor |
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GB/T 7423.3-1987 |
Heat sink of Semiconductor devices--Heat sink, staggered fingers shapes 半导体器件散热器 叉指形散热器 |
China National Standards Semiconductor |
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GB/T 7423.2-1987 |
Heat sink of Semiconductor devices--Heat sink,extruded shapes 半导体器件散热器 型材散热器 |
China National Standards Semiconductor |
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GB/T 7423.1-1987 |
Heat sink of Semiconductor devices--Generic specification 半导体器件散热器 通用技术条件 |
China National Standards Semiconductor |
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GB/T 6648-1986 |
Blank detail specification for Semiconductor inte-grated circuit static read/write memories 半导体集成电路静态读/ 写存储器空白详细规范(可供认证用) |
China National Standards Semiconductor |
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GB/T 3431.2-1986 |
Letter symbols for Semiconductor integrated circuits--Letter symbols for function of pins 半导体集成电路文字符号 引出端功能符号 |
China National Standards Semiconductor |
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GB/T 5839-1986 |
Rating systems for electronic tubes and Semiconductor devices 电子管和半导体器件额定值制 |
China National Standards Semiconductor |
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GB/T 4298-1984 |
The activation analysis method for the determination of elemental impurities in Semiconductor silicon materials 半导体硅材料中杂质元素的活化分析方法 |
China National Standards Semiconductor |
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