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| Standard Code | Standard Title | Standard Class | Order |
|---|---|---|---|
| GB/T 42271-2022 |
Non-contact measurement method for resistivity of semi-insulating silicon carbide single crystal {译} 半绝缘碳化硅单晶的电阻率非接触测试方法 |
China National Standards Measurement method contact |
 English PDF |
| GB/T 26068-2018 |
Test method for carrier recombination lifetime in silicon wafers and silicon ingots—Non-contact measurement of photoconductivity decay by microwave reflectance method 硅片和硅锭载流子复合寿命的测试-非接触微波反射光电导衰减法 |
China National Standards Measurement method contact |
English PDF |
| GB/T 30447-2013 |
Measurement method for contact angle of nano-film surface 纳米薄膜接触角测量方法 |
China National Standards Measurement method contact |
English PDF |
| GB/T 26068-2010 |
Test method for carrier recombination lifetime in silicon wafers by non-contact measurement of photoconductivity decay by microwave reflectance 硅片载流子复合寿命的无接触微波反射光电导衰减测试方法 |
China National Standards Measurement method contact |
English PDF |
| GB/T 24368-2009 |
Test method for hydrophobic contamination on glass by contact angle measurement 玻璃表面疏水污染物检测 接触角测量法 |
China National Standards Measurement method contact |
English PDF |
| GB/T 15709-1995 |
The measurement method of radiated radio interference from contact system of AC electrified railways 交流电气化铁道接触网无线电辐射干扰测量方法 |
China National Standards Measurement method contact |
English PDF |
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