Standard Code | Standard Title | Standard Class | Order |
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GB/T 22319.6-2023 |
Measurement of parameters of quartz crystal components Part 6: Measurement of excitation level dependence (DLD) {译} 石英晶体元件参数的测量 第6部分:激励电平相关性(DLD)的测量 |
China National Standards Measurement quartz crystal |
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GB/T 22319.9-2018 |
Measurement of quartz crystal unit parameters—Part 9:Measurement of spurious resonances of piezoelectric crystal units 石英晶体元件参数的测量 第9部分:石英晶体元件寄生谐振的测量 |
China National Standards Measurement quartz crystal |
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GB/T 22319.11-2018 |
Measurement of quartz crystal unit parameters—Part 11:Standard method for the determination of the load resonance frequency fL and the effective load capacitance CLeff using automatic network analyzer techniques and error correction 石英晶体元件参数的测量 第11部分:采用自动网络分析技术和误差校正确定负载谐振频率和有效负载电容的标准方法 |
China National Standards Measurement quartz crystal |
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GB/T 22319.7-2015 |
Measurement of quartz crystal unit parameters—Part 7: Measurement of activity dips of quartz crystal units 石英晶体元件参数的测量 第7部分:石英晶体元件活性跳变的测量 |
China National Standards Measurement quartz crystal |
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GB/T 22319.8-2008 |
Measurement of quartz crystal unit parameters - Part 8: Test fixture for surface mounted quartz crystal units 石英晶体元件参数的测量 第8部分:表面贴装石英晶体元件用测量夹具 |
China National Standards Measurement quartz crystal |
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