Cart:
| Standard Code | Standard Title | Standard Class | Order |
|---|---|---|---|
| GB/T 13388-2009 |
Method for measuring crystallographic orientation of flats on single-crystal silicon slices and wafers by X-ray techniques 硅片参考面结晶学取向X射线测试方法 |
China National Standards Method measuring crystallographic |
 English PDF |
| Find out:1Items | To Page of: First -Previous-Next -Last | 1 |
+86-755-25831330
