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| Standard Code | Standard Title | Standard Class | Order |
|---|---|---|---|
| GB/T 26068-2018 |
Test method for carrier recombination lifetime in silicon wafers and silicon ingots—Non-contact measurement of photoconductivity decay by microwave reflectance method 硅片和硅锭载流子复合寿命的测试-非接触微波反射光电导衰减法 |
China National Standards Reflectance test method |
 English PDF |
| GB/T 37131-2018 |
Nanotechnologies—Test method of semiconductor nanopowder using UV-Vis diffuse reflectance spectroscopy 纳米技术-半导体纳米粉体材料紫外-可见漫反射光谱的测试方法 |
China National Standards Reflectance test method |
English PDF |
| GB/T 33234-2016 |
Reflectance test method of reflective glass mirror for concentrated solar power system 光热发电玻璃反射镜反射比测试方法 |
China National Standards Reflectance test method |
English PDF |
| GB/T 26068-2010 |
Test method for carrier recombination lifetime in silicon wafers by non-contact measurement of photoconductivity decay by microwave reflectance 硅片载流子复合寿命的无接触微波反射光电导衰减测试方法 |
China National Standards Reflectance test method |
English PDF |
| GB/T 16850.5-2001 |
Basic specification for optical fibre amplifier test methods--Part 5:Test methods for reflectance parameters 光纤放大器试验方法基本规范 第5部分:反射参数的试验方法 |
China National Standards Reflectance test method |
English PDF |
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