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| Standard Code | Standard Title | Standard Class | Order |
|---|---|---|---|
| GB/T 24581-2022 |
Test method for Ⅲ and Ⅴ impurities content in single crystal silicon—Low temperature FT-IR analysis method 硅单晶中III、V族杂质含量的测定 低温傅立叶变换红外光谱法 |
China National Standards Test method Ⅲ |
 English PDF |
| GB/T 24581-2009 |
Test method for low temperature FT-IR analysis of single crystal silicon for Ⅲ-Ⅴ impurities 低温傅立叶变换红外光谱法测量硅单晶中III、V族杂质含量的测试方法 |
China National Standards Test method Ⅲ |
English PDF |
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