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| Standard Code | Standard Title | Standard Class | Order |
|---|---|---|---|
| GB/T 43226-2023 |
Single-event soft error time domain testing method for semiconductor integrated circuits used in aerospace applications {译} 宇航用半导体集成电路单粒子软错误时域测试方法 |
China National Standards Testing method single |
 English PDF |
| GB/T 42676-2023 |
Testing the quality of semiconductor single crystals X-ray diffraction method {译} 半导体单晶晶体质量的测试 X射线衍射法 |
China National Standards Testing method single |
English PDF |
| GB/T 32264-2015 |
Method of performance testing for gas chromatography-single quadrupole mass pectrometry 气相色谱-单四极质谱仪性能测定方法 |
China National Standards Testing method single |
English PDF |
| GB/T 1555-2009 |
Testing methods for determining the orientation of a semiconductor single crystal 半导体单晶晶向测定方法 |
China National Standards Testing method single |
English PDF |
| GB/T 6973-2005 |
Testing methods of single seed drills(precision drills) 单粒(精密)播种机试验方法 |
China National Standards Testing method single |
English PDF |
| GB/T 5886-1986 |
Testing method of single fiber breaking tenacity of ramie 苎麻单纤维断裂强度试验方法 |
China National Standards Testing method single |
English PDF |
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