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| Standard Code | Standard Title | Standard Class | Order |
|---|---|---|---|
| GB/T 42907-2023 |
Testing of non-equilibrium carrier recombination lifetime in silicon ingots, silicon blocks and silicon wafers Non-contact eddy current induction method {译} 硅锭、硅块和硅片中非平衡载流子复合寿命的测试 非接触涡流感应法 |
China National Standards Testing non equilibrium |
 English PDF |
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