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| Standard Code | Standard Title | Standard Class | Order |
|---|---|---|---|
| GB/T 43313-2023 |
Testing of surface quality and microtube density of polished silicon carbide wafers by confocal differential interference method {译} 碳化硅抛光片表面质量和微管密度的测试 共焦点微分干涉法 |
China National Standards Testing surface quality |
 English PDF |
| GB/T 14985-2007 |
General rules of dimensions, shape, surface, quality, testing method and inspection for expansion alloys 膨胀合金尺寸、外形、表面质量、试验方法和检验规则的一般规定 |
China National Standards Testing surface quality |
English PDF |
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