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| Standard Code | Standard Title | Standard Class | Order |
|---|---|---|---|
| GB/T 33922-2017 |
Wafer level test methods for MEMS piezoresistive pressure-sensitive die performances MEMS压阻式压力敏感芯片性能的圆片级试验方法 |
China National Standards Wafer level test |
 English PDF |
| GB/T 33657-2017 |
Nanotechnologies—Electrical operating parameter test specification of wafer level nano-scale phase change memory cells 纳米技术 晶圆级纳米尺度相变存储单元电学操作参数测试规范 |
China National Standards Wafer level test |
English PDF |
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