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| Standard Code | Standard Title | Standard Class | Order |
|---|---|---|---|
| GB/T 40110-2021 |
Surface chemical analysis - Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy 表面化学分析 全反射X射线荧光光谱法（TXRF）测定硅片表面元素污染 |
China National Standards XRF |
 English PDF |
| GB/T 21114-2019 |
Refractories—Chemical analysis by X-ray fluorescence(XRF)—Fused cast-bead method 耐火材料 X射线荧光光谱化学分析 熔铸玻璃片法 |
China National Standards XRF |
English PDF |
| GB/T 30701-2014 |
Surface chemical analysis―Chemical methods for the collection of elements from the surface of silicon-wafer working reference materials and their determination by total-reflection X-ray fluorescence (TXRF) spectroscopy 表面化学分析 硅片工作标准样品表面元素的化学收集方法和全反射X射线荧光光谱法(TXRF)测定 |
China National Standards XRF |
English PDF |
| GB/T 29513-2013 |
Chemical analysis of ferric-containing dust and sludge by XRF-Fused cast bead method 含铁尘泥 X射线荧光光谱化学分析 熔铸玻璃片法 |
China National Standards XRF |
English PDF |
| GB/T 21114-2007 |
Chemical analysis of refractory products by XRF - Fused cast bead method 耐火材料 X射线荧光光谱化学分析 - 熔铸玻璃片法 |
China National Standards XRF |
English PDF |
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