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| Standard Code | Standard Title | Standard Class | Order |
|---|---|---|---|
| GB/T 36474-2018 |
Semiconductor integrated circuit—Measuring methods for double data rate 3 synchronous dynamic random access memory(DDR3 SDRAM) 半导体集成电路 第三代双倍数据速率同步动态随机存储器 (DDR3 SDRAM)测试方法 |
China National Standards circuit—Measuring |
 English PDF |
| GB/T 36477-2018 |
Semiconductor integrated circuit—Measuring methods for flash memory 半导体集成电路 快闪存储器测试方法 |
China National Standards circuit—Measuring |
English PDF |
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