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| Standard Code | Standard Title | Standard Class | Order |
|---|---|---|---|
| GB/T 28872-2012 |
Testing method of magnetic lightly-striking mode atomic force microscope for nanotopography of living cells 活细胞样品纳米结构的磁驱动轻敲模式原子力显微镜检测方法 |
China National Standards lightly |
 English PDF |
| GB/T 14847-2010 |
Test mothod for thickness of lightly doped silicon epitaxial layers on heavily doped silicon substrates by infrared reflectance 重掺杂衬底上轻掺杂硅外延层厚度的红外反射测量方法 |
China National Standards lightly |
English PDF |
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