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| Standard Code | Standard Title | Standard Class | Order |
|---|---|---|---|
| GB/T 27788-2020 |
Microbeam analysis—Scanning electron microscopy—Guidelines for calibrating image magnification 微束分析 扫描电镜 图像放大倍率校准导则 |
China National Standards magnification |
 English PDF |
| GB/T 22059-2018 |
Microscopes—Values, tolerances and symbols for magnification 显微镜-放大率数值、允差和符号 |
China National Standards magnification |
English PDF |
| GB/T 34002-2017 |
Microbeam analysis—Analytical transmission electron microscopy—Methods for calibrating image magnification by using reference materials having periodic structures 微束分析 透射电子显微术 用周期结构标准物质校准图像放大倍率的方法 |
China National Standards magnification |
English PDF |
| GB/T 27788-2011 |
Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification 微束分析 扫描电镜 图像放大倍率校准导则 |
China National Standards magnification |
English PDF |
| GB/T 27760-2011 |
Test method for calibrating the z-magnification of an atomic force microscope at subnanometer displacement levels using si (111) monatomic steps 利用Si（111）晶面原子台阶对原子力显微镜亚纳米高度测量进行校准的方法 |
China National Standards magnification |
English PDF |
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