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| Standard Code | Standard Title | Standard Class | Order |
|---|---|---|---|
| GB/T 26069-2022 |
Annealed monocrystalline silicon wafers 硅单晶退火片 |
China National Standards monocrystal |
 English PDF |
| GB/T 1551-2021 |
Test method for measuring resistivity of monocrystal silicon—In-line four-point probe and direct current two-point probe method 硅单晶电阻率的测定 直排四探针法和直流两探针法 |
China National Standards monocrystal |
English PDF |
| GB/T 8760-2020 |
Test method for dislocation density of monocrystal gallium arsenide 砷化镓单晶位错密度的测试方法 |
China National Standards monocrystal |
English PDF |
| GB/T 5252-2020 |
Test method for dislocation density of monocrystal germanium 锗单晶位错密度的测试方法 |
China National Standards monocrystal |
English PDF |
| GB/T 5238-2019 |
monocrystalline germanium and monocrystalline germanium slices 锗单晶和锗单晶片 |
China National Standards monocrystal |
English PDF |
| GB/T 26071-2018 |
monocrystalline silicon wafers for solar cells 太阳能电池用硅单晶片 |
China National Standards monocrystal |
English PDF |
| GB/T 12964-2018 |
monocrystalline silicon polished wafers 硅单晶抛光片 |
China National Standards monocrystal |
English PDF |
| GB/T 12965-2018 |
monocrystalline silicon as cut wafers and lapped wafers 硅单晶切割片和研磨片 |
China National Standards monocrystal |
English PDF |
| GB/T 25076-2018 |
monocrystalline silicon for solar cell 太阳能电池用硅单晶 |
China National Standards monocrystal |
English PDF |
| GB/T 34481-2017 |
Test method for measuring etch pit density (EPD) in low dislocation density monocrystalline germanium slices 低位错密度锗单晶片腐蚀坑密度(EPD)的测量方法 |
China National Standards monocrystal |
English PDF |
| GB/T 35305-2017 |
monocrystalline gallium arsenide polished wafers for solar cell 太阳能电池用砷化镓单晶抛光片 |
China National Standards monocrystal |
English PDF |
| GB/T 32278-2015 |
Test methods for flatness of monocrystalline silicon carbide wafers 碳化硅单晶片平整度测试方法 |
China National Standards monocrystal |
English PDF |
| GB/T 12962-2015 |
monocrystalline silicon 硅单晶 |
China National Standards monocrystal |
English PDF |
| GB/T 31351-2014 |
Nondestructive test method for micropipe density of polished monocrystalline silicon carbide wafers 碳化硅单晶抛光片微管密度无损检测方法 |
China National Standards monocrystal |
English PDF |
| GB/T 30656-2014 |
Polished monocrystalline silicon carbide wafers 碳化硅单晶抛光片 |
China National Standards monocrystal |
English PDF |
| GB/T 31093-2014 |
Test method for stress of monocrystalline sapphire ingot 蓝宝石晶锭应力测试方法 |
China National Standards monocrystal |
English PDF |
| GB/T 31092-2014 |
monocrystalline sapphire ingot 蓝宝石单晶晶锭 |
China National Standards monocrystal |
English PDF |
| GB/T 30868-2014 |
Test method for measuring micropipe density of monocrystalline silicon carbide wafers―Chemically etching 碳化硅单晶片微管密度的测定 化学腐蚀法 |
China National Standards monocrystal |
English PDF |
| GB/T 30867-2014 |
Test method for measuring thickness and total thickness variation of monocrystalline silicon carbide wafers 碳化硅单晶片厚度和总厚度变化测试方法 |
China National Standards monocrystal |
English PDF |
| GB/T 30866-2014 |
Test method for measuring diameter of monocrystalline silicon carbide wafers 碳化硅单晶片直径测试方法 |
China National Standards monocrystal |
English PDF |
| GB/T 29508-2013 |
300mm monocrystalline silicon as cut slices and grinded slices 300mm 硅单晶切割片和磨削片 |
China National Standards monocrystal |
English PDF |
| GB/T 29506-2013 |
300mm polished monocrystalline silicon wafers 300mm 硅单晶抛光片 |
China National Standards monocrystal |
English PDF |
| GB/T 29504-2013 |
300mm monocrystalline silicon 300mm 硅单晶 |
China National Standards monocrystal |
English PDF |
| GB/T 26074-2010 |
Germanium monocrystal-measurement of resistivity-DC linear four-point probe 锗单晶电阻率直流四探针测量方法 |
China National Standards monocrystal |
English PDF |
| GB/T 25076-2010 |
monocrystalline silicon of solar cell 太阳电池用硅单晶 |
China National Standards monocrystal |
English PDF |
| GB/T 5238-2009 |
monocrystalline germanium and monocrystalline germanium slices 锗单晶和锗单晶片 |
China National Standards monocrystal |
English PDF |
| GB/T 1551-2009 |
Test method for measuring resistivity of monocrystal silicon 硅单晶电阻率测定方法 |
China National Standards monocrystal |
English PDF |
| GB/T 5252-2006 |
Germanium monocrystal - inspection of dislocation etch pit density 锗单晶位错腐蚀坑密度测量方法 |
China National Standards monocrystal |
English PDF |
| GB/T 12965-2005 |
monocrystalline silicon as cut slices and lapped slices 硅单晶切割片和研磨片 |
China National Standards monocrystal |
English PDF |
| GB/T 19199-2003 |
Test method for carbon concentration of semi-insulating monocrystal gallium arsenide by measurement infrared absorption method 半绝缘砷化镓单晶中碳浓度的红外吸收测试方法 |
China National Standards monocrystal |
English PDF |
| GB/T 12964-2003 |
monocrystalline silicon polished wafers 硅单晶抛光片 |
China National Standards monocrystal |
English PDF |
| GB/T 17170-1997 |
Test method for deep level EL2 concentration of undoped semiinsulating monocrystal gallium arsenide by measurement infra-red absorption method 非掺杂半绝缘砷化镓单晶深能级EL2浓度红外吸收测试方法 |
China National Standards monocrystal |
English PDF |
| GB/T 13843-1992 |
Polished monocrystalline sapphire substrates 蓝宝石单晶抛光衬底片 |
China National Standards monocrystal |
English PDF |
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