Standard Code | Standard Title | Standard Class | Order |
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GB/T 28893-2024 |
Surface chemical analysis-Auger electron spectroscopy and X-ray photoelectron spectroscopy-methods for determining peak intensity and information required for reporting results {译} 表面化学分析-俄歇电子能谱和X射线光电子能谱-测定峰强度的方法和报告结果所需的信息 |
China National Standards photoelectron |
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GB/T 28892-2024 |
Surface chemical analysis-X-ray photoelectron spectroscopy-selected instrument performance parameter statements {译} 表面化学分析-X射线光电子能谱-选择仪器性能参数的表述 |
China National Standards photoelectron |
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GB/T 43598-2023 |
Nanotechnology Determination of oxygen content and carbon-to-oxygen ratio of graphene powder X-ray photoelectron spectroscopy {译} 纳米技术 石墨烯粉体氧含量和碳氧比的测定 X射线光电子能谱法 |
China National Standards photoelectron |
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GB/T 41073-2021 |
Surface chemical analysis -- Electron spectroscopies -- Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy 表面化学分析 电子能谱 X射线光电子能谱峰拟合报告的基本要求 |
China National Standards photoelectron |
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GB/T 41064-2021 |
Surface chemical analysis—Depth profiling—Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and multi-layer thin films 表面化学分析 深度剖析 用单层和多层薄膜测定X射线光电子能谱、俄歇电子能谱和二次离子质谱中深度剖析溅射速率的方法 |
China National Standards photoelectron |
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GB/T 41072-2021 |
Surface chemical analysis -- Electron spectroscopies -- Guidelines for ultraviolet photoelectron spectroscopy analysis 表面化学分析 电子能谱 紫外光电子能谱分析指南 |
China National Standards photoelectron |
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GB/T 36401-2018 |
Surface chemical analysis—X-ray photoelectron spectroscopy—Reporting of results of thin-film analysis 表面化学分析 X射线光电子能谱 薄膜分析结果的报告 |
China National Standards photoelectron |
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GB/T 22571-2017 |
Surface chemical analysis—X-ray photoelectron spectrometers—Calibration of energy scales 表面化学分析 X射线光电子能谱仪 能量标尺的校准 |
China National Standards photoelectron |
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GB/T 33502-2017 |
Surface chemical analysis—Recording and reporting data in X-ray photoelectron spectroscopy(XPS) 表面化学分析 X射线光电子能谱(XPS)数据记录与报告的规范要求 |
China National Standards photoelectron |
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GB/Z 32490-2016 |
Surface chemical analysis—X-ray photoelectron spectroscopy—Procedures for determining backgrounds 表面化学分析 X射线光电子能谱 确定本底的程序 |
China National Standards photoelectron |
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GB/T 31472-2015 |
Standard guide to charge control and charge referencing techniques in X-ray photoelectron spectroscopy X光电子能谱中荷电控制和荷电基准技术标准指南 |
China National Standards photoelectron |
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GB/T 31470-2015 |
Standard practice for determination of the specimen area contributing to the detected signal in Auger electron spectrometers and some X-ray photoelectron spectrometers 俄歇电子能谱与X射线光电子能谱测试中确定检测信号对应样品区域的通则 |
China National Standards photoelectron |
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GB/T 30704-2014 |
Surface chemical analysis―X-ray photoelectron spectroscopy―Guidelines for analysis 表面化学分析 X射线光电子能谱 分析指南 |
China National Standards photoelectron |
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GB/T 30702-2014 |
Surface chemical analysis―Auger electron spectroscopy and X-ray photoelectron spectroscopy―Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials 表面化学分析 俄歇电子能谱和X射线光电子能谱 实验测定的相对灵敏度因子在均匀材料定量分析中的使用指南 |
China National Standards photoelectron |
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GB/T 29556-2013 |
Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - determination of lateral resolution, analysis area, and sample area viewed by the analyser 表面化学分析 俄歇电子能谱和X射线光电子能谱 横向分辨率、分析面积和分析器所能检测到的样品面积的测定 |
China National Standards photoelectron |
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GB/T 28893-2012 |
Surface Chemical Analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Methods used to determine peak intensities and information required when reporting results 表面化学分析 俄歇电子能谱和X射线光电子能谱 测定峰强度的方法和报告结果所需的信息 |
China National Standards photoelectron |
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GB/T 28892-2012 |
Surface chemical analysis - X-ray photoelectron spectroscopy -Description of selected instrumental performance parameters 表面化学分析 X射线光电子能谱 选择仪器性能参数的表述 |
China National Standards photoelectron |
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GB/T 28633-2012 |
Surface chemical analysis - X-ray photoelectron spectroscopy - Repeatability and constancy of intensity scale 表面化学分析 X射线光电子能谱 强度标的重复性和一致性 |
China National Standards photoelectron |
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GB/T 28632-2012 |
Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Determination of lateral resolution 表面化学分析 俄歇电子能谱和X射线光电子能谱 横向分辨率测定 |
China National Standards photoelectron |
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GB/T 25188-2010 |
Thickness measurements for ultrathin silicon oxide layers on silicon wafers X-ray photoelectron spectroscopy 硅晶片表面超薄氧化硅层厚度的测量 X射线光电子能谱法 |
China National Standards photoelectron |
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GB/T 25185-2010 |
Surface chemical analysis - X-ray photoelectron spectroscopy - Reporting of methods used for charge control and charge correction 表面化学分析 X射线光电子能谱 - 荷电控制和荷电校正方法的报告 |
China National Standards photoelectron |
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GB/T 25184-2010 |
Verification method for X-ray photoelectron spectrometers X射线光电子能谱仪检定方法 |
China National Standards photoelectron |
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GB/T 22571-2008 |
Surface chemical analysis ?X-ray photoelectron spectrometers ?Calibration of energy scales 表面化学分析 X射线光电子能谱仪 能量标尺的校准 |
China National Standards photoelectron |
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GB/T 21006-2007 |
Surface chemical analysis - X-ray photoelectron and Auger electron spectrometers - Linearity of intensity scale 表面化学分析 X射线光电子能谱仪和俄歇电子能谱仪 强度标的线性 |
China National Standards photoelectron |
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GB/T 19500-2004 |
General rules for X-ray photoelectron spectroscopic analysis method X-射线光电子能谱分析方法通则 |
China National Standards photoelectron |
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