Standard Code | Standard Title | Standard Class | Order |
---|---|---|---|
GB/T 42905-2023 |
Testing of Silicon Carbide Epitaxial Layer Thickness Infrared reflection Method {译} 碳化硅外延层厚度的测试 红外反射法 |
China National Standards reflection |
English PDF |
GB/T 42360-2023 |
Surface Chemical Analysis Total reflection X-ray Fluorescence Spectroscopy of Water {译} 表面化学分析 水的全反射X射线荧光光谱分析 |
China National Standards reflection |
English PDF |
GB/T 26332.5-2022 |
Optics and photonics - Optical films - Part 5: Basic requirements for antireflection coatings {译} 光学和光子学 光学薄膜 第5部分:减反射膜基本要求 |
China National Standards reflection |
English PDF |
GB/T 41894.2-2022 |
Ships and marine technology - Determination of shaft power in ship propulsion systems by measuring shaft deflection - Part 2: Optical reflection method {译} 船舶与海上技术 通过测量轴变形量确定船舶推进系统轴功率 第2部分:光学反射法 |
China National Standards reflection |
English PDF |
GB/T 40279-2021 |
Test method for thickness of films on silicon wafer surface—Optical reflection method 硅片表面薄膜厚度的测试 光学反射法 |
China National Standards reflection |
English PDF |
GB/T 40110-2021 |
Surface chemical analysis - Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy 表面化学分析 全反射X射线荧光光谱法(TXRF)测定硅片表面元素污染 |
China National Standards reflection |
English PDF |
GB/T 5095.2507-2021 |
Electromechanical components for electronic equipment—Basic testing procedures and measuring methods—Part 25-7: Test 25g: Impedance, reflection coefficient, and voltage standing wave ratio (VSWR) 电子设备用机电元件 基本试验规程及测量方法 第25-7部分:试验25g:阻抗、反射系数和电压驻波比(VSWR) |
China National Standards reflection |
English PDF |
GB/T 5095.2304-2021 |
Electromechanical components for electronic equipment—Basic testing procedures and measuring methods—Part 23-4: Screening and filtering tests—Test 23d: Transmission line reflections in the time domain 电子设备用机电元件 基本试验规程及测量方法 第23-4部分:屏蔽和滤波试验 试验23d:时域内传输线的反射 |
China National Standards reflection |
English PDF |
GB/T 40965-2021 |
Measurement of retroreflection 回复反射的测量方法 |
China National Standards reflection |
English PDF |
GB/T 11313.201-2018 |
Radio-frequency connectors—Part 201:Electrical test methods—reflection coefficient and voltage standing wave ratio 射频连接器 第201部分:电气试验方法 反射系数和电压驻波比 |
China National Standards reflection |
English PDF |
GB/T 33705-2017 |
Soil moisture observation—Frequency domain reflection method 土壤水分观测 频域反射法 |
China National Standards reflection |
English PDF |
GB/T 33153-2016 |
Imaging materials—reflection colour photographic prints—Test print construction and measurement 影像材料 反射彩色摄影照片 测试照片结构和测量 |
China National Standards reflection |
English PDF |
GB/T 33152-2016 |
Imaging materials—Wet-processed silver-gelatin type black-and-white photographic reflection prints—Specifications for dark storage 影像材料 湿法加工银胶型黑白照相反射胶片 暗室储存规范 |
China National Standards reflection |
English PDF |
GB/T 32523-2016 |
Acoustics—Measurement of sound pressure reflection coefficient, sound pressure transmission coefficient and absorption coefficient for underwater acoustical material sample—Travelling wave tube method 声学 水声材料样品声压反射系数、声压透射系数和吸声系数的测量 行波管法 |
China National Standards reflection |
English PDF |
GB/T 24578-2015 |
Test method for measuring surface metal contamination on silicon wafers by total reflection X-Ray fluorescence spectroscopy 硅片表面金属沾污的全反射X光荧光光谱测试方法 |
China National Standards reflection |
English PDF |
GB/T 30701-2014 |
Surface chemical analysis―Chemical methods for the collection of elements from the surface of silicon-wafer working reference materials and their determination by total-reflection X-ray fluorescence (TXRF) spectroscopy 表面化学分析 硅片工作标准样品表面元素的化学收集方法和全反射X射线荧光光谱法(TXRF)测定 |
China National Standards reflection |
English PDF |
GB/T 13170-2011 |
Test charts of reflection for television 反射式电视测试图 |
China National Standards reflection |
English PDF |
GB/T 26828-2011 |
Specication for multispectral antireflection coatings 多光谱减反射膜规范 |
China National Standards reflection |
English PDF |
GB/T 24578-2009 |
Test method for measuring surface metal contamination on silicon wafers by total reflection X-ray fluorescence spectroscopy 硅片表面金属沾污的全反射X光荧光光谱测试方法 |
China National Standards reflection |
English PDF |
GB/T 23912-2009 |
Non-destructive testing - Practice for immersed ultrasonic testing by the reflection method using pulsed longitudinal waves 无损检测 液浸式超声纵波脉冲反射检测方法 |
China National Standards reflection |
English PDF |
GB/T 23649-2009 |
Graphic technology - Process control - Optical, geometrical and metrological requirements for reflection densitometers for graphic arts use 印刷技术 过程控制 印刷用反射密度计的光学、几何学和测量学要求 |
China National Standards reflection |
English PDF |
GB/T 12823.4-2008 |
Photography - Density measurement - Part 4: Geometric conditions for reflection density 摄影 密度测量 第4部分:反射密度的几何条件 |
China National Standards reflection |
English PDF |
GB 19436.3-2008 |
Electrical safety of machinery - Electro-sensitive protective equipment - Part 3: Particular requirements for Active Opto-electronic Protective Devices responsive to Diffuse reflection(AOPDDR) 机械电气安全 电敏防护装置 第3部分:使用有源光电漫反射防护器件(AOPDDR)设备的特殊要求 |
China National Standards reflection |
English PDF |
GB/T 18722-2002 |
Graphic technology--Application of reflection densitometry and colorimetry to process control in graphic arts 印刷技术 反射密度测量和色度测量在印刷过程控制中的应用 |
China National Standards reflection |
English PDF |
GB/T 9403-1988 |
The reflection grayscale test chart 反射式灰度级测试图 |
China National Standards reflection |
English PDF |
GB/T 3175.2-1987 |
reflection flesh tone test card 反射式肤色测试图 |
China National Standards reflection |
English PDF |
GB/T 3175.1-1987 |
reflection colour bar test card 反射式彩条测试图 |
China National Standards reflection |
English PDF |
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