Cart:
| Standard Code | Standard Title | Standard Class | Order |
|---|---|---|---|
| GB/T 1551-2021 |
Test method for measuring resistivity of monocrystal silicon—In-line four-point probe and direct current two-point probe method 硅单晶电阻率的测定 直排四探针法和直流两探针法 |
China National Standards silicon—In |
 English PDF |
| GB/T 37049-2018 |
Test method for the content of metal impurity in electronic grade polysilicon—Inductively coupled-plasma mass spectrometry method 电子级多晶硅中基体金属杂质含量的测定-电感耦合等离子体质谱法 |
China National Standards silicon—In |
English PDF |
| Find out:2Items | To Page of: First -Previous-Next -Last | 1 |
+86-755-25831330
