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| Standard Code | Standard Title | Standard Class | Order |
|---|---|---|---|
| GB/T 24581-2022 |
Test method for Ⅲ and Ⅴ impurities content in single crystal silicon—Low temperature FT-IR analysis method 硅单晶中III、V族杂质含量的测定 低温傅立叶变换红外光谱法 |
China National Standards silicon—Low |
 English PDF |
| GB/T 35306-2017 |
Test method for carbon and oxygen content of single crystal silicon—Low temperature fourier transform infrared spectrometry 硅单晶中碳、氧含量的测定 低温傅立叶变换红外光谱法 |
China National Standards silicon—Low |
English PDF |
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