China 'GB/T 26068-2018
' standard english version:
NATIONAL STANDARD OF THE PEOPLE'S REPUBLIC OF CHINA
GB/T 26068-2018
Test method for carrier recombination lifetime in silicon wafers and silicon ingots—Non-contact measurement of photoconductivity decay by microwave reflectance method 硅片和硅锭载流子复合寿命的测试-非接触微波反射光电导衰减法
Issued Date:2018
Implemented Date:2019-11-1
Issued by:
The Standardization Administration of the People's Republic of China
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