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| Standard Code | Standard Title | Standard Class | Order |
|---|---|---|---|
| JC/T 2133-2012 |
Determination of impurities in silica sol for polishing solution in semiconductor industry. Inductively coupled plasma atomic emission spectrometric method 半导体抛光液用硅溶胶中杂质元素含量的测定 -电感耦合等离子体原子发射光谱法 |
China Building Materials
Standards Determination impurities silica |
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