Cart:
Keyword:
| Standard Code | Standard Title | Standard Class | Order |
|---|---|---|---|
| YY/T 0870.3—2019 |
Medical device genotoxicity testing Part 3: Tk gene mutation testing with mouse lymphoma cells {译} 医疗器械遗传毒性试验 第3部分：用小鼠淋巴瘤细胞进行的TK基因突变试验 |
China Pharmaceutics Industry
Standards Tk |
 English PDF |
| YY/T 0127.17-2014 |
Biological evaluation of medical devices used in dentistry. Part 17: Mouse lymphoma cells (Tk) gene mutation test 口腔医疗器械生物学评价 第17部分:小鼠淋巴瘤细胞(TK)基因突变试验 |
China Medicine & Medical Device
Standards Tk |
English PDF |
| YY/T 0127.17-2014 |
Biological Evaluation of Oral Medical Devices Part 17: Murine Lymphoma Cell (Tk) Gene Mutation Test{译} {译} 口腔医疗器械生物学评价 第17部分：小鼠淋巴瘤细胞（TK）基因突变试验 |
China Pharmaceutics Industry
Standards Tk |
English PDF |
| SN/T 3432-2012 |
Detection and identification of Diaporthe helianthi Muntanola-CveTkovic 向日葵茎溃疡病菌检疫鉴定方法 |
China Import Export Inspection
Standards Tk |
English PDF |
| AQ 1032-2007 |
Safety inspection code of JTk winder for coal mines 煤矿用jtk型提升绞车安全检验规范 |
China Safety & Security
Standards Tk |
English PDF |
| SN/T 1577-2005 |
Rules for the quarantine of walnuTkernels for import and export 进出境核桃仁检疫操作规程 |
China Import Export Inspection
Standards Tk |
English PDF |
| SJ 50924/3-2002 |
Capacitors, fixed, ceramic dielectric, estabilished reliability, type CTk403, detail specification for ctk403型有可靠性指标的瓷介固定电容器详细规范 |
China Electronics
Standards Tk |
English PDF |
| SJ 50924/2-2002 |
Capacitors, fixed, ceramic dielectric, estabilished reliability, type CTk402, detail specification for ctk402型有可靠性指标的瓷介固定电容器详细规范 |
China Electronics
Standards Tk |
English PDF |
| SJ 50924/1-2002 |
Capacitors, fixed, ceramic dielectric, estabilished reliability, type CTk401, detail specification for ctk401型有可靠性指标的瓷介固定电容器详细规范 |
China Electronics
Standards Tk |
English PDF |
| SJ 50033/128-1997 |
Semiconductor discrete devices. Detail specification for type 2DK15 SCHOTTkY ailicon switching rectifier diode 半导体分立器件2dk15型硅肖特基开关整流二极管详细规范 |
China Electronics
Standards Tk |
English PDF |
| SJ 50033/127-1997 |
Semiconductor discrete devices. Detail specification for type 2DK14 SCHOTTkY ailicon switching rectifier diode 半导体分立器件2dk14型硅肖特基开关整流二极管详细规范 |
China Electronics
Standards Tk |
English PDF |
| SJ 50033/126-1997 |
Semiconductor discrete device. Detail specification for type 2DK13 SCHOTTkY ailicon switching rectifier diode 半导体分立器件2dk13型硅肖特基开关整流二极管详细规范 |
China Electronics
Standards Tk |
English PDF |
| SJ/T 11042-1996 |
Test method for temperature (Tk-100) while volume resistivity of electronic glass is 100MΩ·cm 电子玻璃体积电阻率为１００ｍω·ｃｍ时的温度（ｔｋ－１００）的测试方法 |
China Electronics
Standards Tk |
English PDF |
| SJ 20316-1993 |
Detail specification capacitors, fixed, ceramic dielectric, established reliability Type CTk8116 ｃｔｋ８１１６型有可靠性指标的瓷介固定电容器详细规范 |
China Electronics
Standards Tk |
English PDF |
| SJ 20315-1993 |
Detail specification capacitors, fixed, ceramic dielectric, established reliability Type CTk8110 ｃｔｋ８１１０型有可靠性指标的瓷介固定电容器详细规范 |
China Electronics
Standards Tk |
English PDF |
| SJ 20314-1993 |
Detail specification capacitors, chip, multiple layer, fixed, unencapsulated, ceramic dielectric, established reliability Type CTk4104 ｃｔｋ４１０４型有可靠性指标的非密封多层片状瓷介固定电容器详细规范 |
China Electronics
Standards Tk |
English PDF |
| SJ 20313-1993 |
Detail specification capacitors, chip, multiple layer, fixed, unencapsulated, ceramic dielectric, established reliability Type CTk4103 ｃｔｋ４１０３型有可靠性指标的非密封多层片状瓷介固定电容器详细规范 |
China Electronics
Standards Tk |
English PDF |
| SJ 20312-1993 |
Detail specification capacitors, chip, multiple layer, fixed, unencapsulated, ceramic dielectric, established reliability Type CTk4102 ｃｔｋ４１０２型有可靠性指标的非密封多层片状瓷介固定电容器详细规范 |
China Electronics
Standards Tk |
English PDF |
| SJ 20203-1992 |
Detail specification capacitors, chip, multiple layer, fixed, unencapsulated, ceramic dielectric, established reliability, type CTk4101 ｃｔｋ４１０１型有可靠性指标的非密封多层片状瓷介固定电容器详细规范 |
China Electronics
Standards Tk |
English PDF |
| Find out:19Items | To Page of: First -Previous-Next -Last | 1 |
+86-755-25831330
