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| Standard Code | Standard Title | Standard Class | Order |
|---|---|---|---|
| SJ/T 11761-2020 |
Specification for Load Ports of Semiconductor Equipment for wafers 200mm and Smaller {译} 200mm及以下晶圆用半导体设备装载端口规范 |
China Electronics Industry
Standards wafers |
 English PDF |
| SJ/T 11629-2016 |
(Solar wafers and cells online photoluminescence analysis) 太阳能电池用硅片和电池片的在线光致发光分析方法 |
China Electronics
Standards wafers |
English PDF |
| SJ/T 11627-2016 |
(Solar wafers rate online Test methods Resistance) 太阳能电池用硅片电阻率在线测试方法 |
China Electronics
Standards wafers |
English PDF |
| SN/T 4383-2015 |
(Food contact material wafers polyvinyl alcohol (PVA) Determination of UV - visible spectrophotometry) 食品接触材料 糯米纸 聚乙烯醇（pva）含量的测定 紫外-可见分光光度法 |
China Import Export Inspection
Standards wafers |
English PDF |
| SJ/T 11505-2015 |
Sapphire single crystal polished wafers specification 蓝宝石单晶抛光片规范 |
China Electronics
Standards wafers |
English PDF |
| SJ/T 11503-2015 |
Test methods for measuring surface roughness of polished monocrystalline silicon carbide wafers 碳化硅单晶抛光片表面粗糙度的测试方法 |
China Electronics
Standards wafers |
English PDF |
| SJ/T 11502-2015 |
Specification for polished monocrystalline silicon carbide wafers 碳化硅单晶抛光片规范 |
China Electronics
Standards wafers |
English PDF |
| SJ/T 11497-2015 |
Test method for thermal stability testing of gallium arsenide wafers 砷化镓晶片热稳定性的试验方法 |
China Electronics
Standards wafers |
English PDF |
| SJ/T 11492-2015 |
Test methods for measurement of composition of gallium arsenide phosphide wafers by photoluminescence 光致发光法测定磷镓砷晶片的组分 |
China Electronics
Standards wafers |
English PDF |
| SJ/T 11490-2015 |
Test method for measuring etch pit density (EPD) in low dislocation density gallium arsenide wafers 低位错密度砷化镓抛光片蚀坑密度的测量方法 |
China Electronics
Standards wafers |
English PDF |
| SJ/T 11489-2015 |
Test method for measuring etch pit density (EPD) in low dislocation density indium phosphide wafers 低位错密度磷化铟抛光片蚀坑密度的测量方法 |
China Electronics
Standards wafers |
English PDF |
| SJ/T 11470-2014 |
(Light-emitting diode epitaxial wafers) 发光二极管外延片 |
China Electronics
Standards wafers |
English PDF |
| SJ 20658-1998 |
Specification for radiation hardened monocrystal silicon wafers for military CMOS integrated circuits 军用电站方舱通用规范 |
China Electronics
Standards wafers |
English PDF |
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