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| Standard Code | Standard Title | Standard Class | Order |
|---|---|---|---|
| SJ/T 11503-2015 |
Test methods for measuring surface roughness of polished monocrystalline silicon carbide wafers 碳化硅单晶抛光片表面粗糙度的测试方法 |
China Electronics
Standards Test method roughness |
 English PDF |
| FZ/T 01115-2012 |
Test method of roughness behaviour for fabric surface 织物表面粗糙性能的试验方法 |
China Textile & Garment industry
Standards Test method roughness |
English PDF |
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