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| Standard Code | Standard Title | Standard Class | Order |
|---|---|---|---|
| SJ/T 11504-2015 |
Test method for measuring surface quality of polished monocrystalline silicon carbide 碳化硅单晶抛光片表面质量的测试方法 |
China Electronics
Standards monocrystalline |
 English PDF |
| SJ/T 11503-2015 |
Test methods for measuring surface roughness of polished monocrystalline silicon carbide wafers 碳化硅单晶抛光片表面粗糙度的测试方法 |
China Electronics
Standards monocrystalline |
English PDF |
| SJ/T 11502-2015 |
Specification for polished monocrystalline silicon carbide wafers 碳化硅单晶抛光片规范 |
China Electronics
Standards monocrystalline |
English PDF |
| SJ/T 11501-2015 |
Test method for determining crystal type of monocrystalline silicon carbide 碳化硅单晶晶型的测试方法 |
China Electronics
Standards monocrystalline |
English PDF |
| SJ/T 11500-2015 |
Test method for measuring crystallographic orientation of monocrystalline silicon carbide 碳化硅单晶晶向的测试方法 |
China Electronics
Standards monocrystalline |
English PDF |
| SJ/T 11499-2015 |
Test method for measuring electrical properties of monocrystalline silicon carbide 碳化硅单晶电学性能的测试方法 |
China Electronics
Standards monocrystalline |
English PDF |
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