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| Standard Code | Standard Title | Standard Class | Order |
|---|---|---|---|
| SJ/T 1838-2016 |
(Semiconductor discrete device 3DK29 silicon NPN low power switching transistor detailed specification) 半导体分立器件 3dk29型ｎｐｎ硅小功率开关晶体管详细规范 |
China Electronics
Standards K2, |
 English PDF |
| SJ/T 1831-2016 |
(Semiconductor discrete device 3DK28 silicon NPN low power switching transistor detailed specification) 半导体分立器件 3dk28型ｎｐｎ硅小功率开关晶体管详细规范 |
China Electronics
Standards K2, |
English PDF |
| SN/T 0481.10-2011 |
Methods of inspection of bauxite for export. Part 10: Determination of SiO2,Fe2O3,Al2O3,CaO,MgO,K2O,P2O5 and TiO2. X-Ray fluorescence spectrometric method 出口矾土检验方法 第10部分：二氧化硅、三氧化二铁、三氧化二铝、氧化钙、氧化镁、氧化钾、五氧化二磷和二氧化钛的测定 x射线荧光光谱法 |
China Import Export Inspection
Standards K2, |
English PDF |
| SJ 50972/3-2002 |
Capacitors, fixed, metallized polycarbonate film dielectric, DC, estabilshed reliabilty, type CLSK235, detail specification for clsk235型有可靠性指标的金属化聚碳酸酯薄膜介质直流固定电容器详细规范 |
China Electronics
Standards K2, |
English PDF |
| SJ 50603/4-2001 |
Capacitors, fixed, electrolytic(aluminum oxide) established reliability, type CDK294 detail specification for cdk294型有可靠性指标的铝电解固定电容器详细规范 |
China Electronics
Standards K2, |
English PDF |
| SJ 51432/4-2000 |
Resistors, fixed, film, chip established reliability, style RMK2021, detail specification for rmk2012型有可靠性指标的片式膜固定电阻器详细规范 |
China Electronics
Standards K2, |
English PDF |
| SJ 50033/116-1997 |
Semiconductor discrete devices. Detail specification for type 2CK29 silicon large current switch diode 半导体分立器件2ck29型硅大电流开关二极管详细规范 |
China Electronics
Standards K2, |
English PDF |
| SJ 50033/115-1997 |
Semiconductor discrete devices. Detail specification for type 2CK28 silicon large current switch diode 半导体分立器件2ck28型硅大电流开关二极管详细规范 |
China Electronics
Standards K2, |
English PDF |
| SJ/T 10909-1996 |
Determination of K2O Na2O and Li2O in electronic glass by EDTA complexicretric titration fmission spectrcopy 电子玻璃中氧化钾、氧化钠和氧化锂的火焰光度测定法 |
China Electronics
Standards K2, |
English PDF |
| SJ/T 10894-1996 |
Determination of Li2O Na2O and K2O in electronic glass by atomic absorption 电子玻璃中氧化锂、氧化钠和氧化钾的原子吸收分析 |
China Electronics
Standards K2, |
English PDF |
| SJ 50603/3-1995 |
Capacitors, fixed, electrolytic(aluminum oxide), established reliability, style CDK29A detail specification for ｃｄｋ２９ａ型有可靠性指标的固定铝电解电容器详细规范 |
China Electronics
Standards K2, |
English PDF |
| SJ 50972/2-1994 |
Capacitors, fixed, metallized polyethylene-terephthalate dielectric, DC, estabilshed reliabilty, Style CLK234 detail specification for 有可靠性指标的ｃｌｋ２３４型金属化聚对苯二甲酸乙二醇酯薄膜介质直流固定电容器详细规范 |
China Electronics
Standards K2, |
English PDF |
| SJ 50972/1-1994 |
Detailed specifications for CLSK28 and CLSK29 fixed metalized polycarbonate film dielectric DC capacitors with reliability indexes 有可靠性指标的ｃｌｓｋ２８和ｃｌｓｋ２９型金属化聚碳酸酯薄膜介质直流固定电容器详细规范 |
China Electronics
Standards K2, |
English PDF |
| SJ 50033/9-1994 |
Discrete semiconductor devices Detailed specifications for 3DK206 power switching transistors 半导体分立器件 ３ｄｋ２０６型功率开关晶体管详细规范 |
China Electronics
Standards K2, |
English PDF |
| SJ 50033/29-1994 |
Semiconductor discrete device. Detail specification for GaAs high-speed switching assembly for type EK20 半导体分立器件 ｅｋ２０型砷化镓高速开关组件详细规范 |
China Electronics
Standards K2, |
English PDF |
| SJ 50033/2-1994 |
Semiconductor discret device. Detail specification for type 3CK2904, 3CK2904A, 3CK2905 and 3CK2905A PNP silicon cow-power switching transistor 半导体分立器件 ３ｃｋ２９０４（２９０４ａ、２９０５和２９０５ａ）型ｐｎｐ硅小功率开关晶体管详细规范 |
China Electronics
Standards K2, |
English PDF |
| SJ 50033/13-1994 |
Discrete semiconductor devices Detailed specifications for 3DK210 power switching transistors 半导体分立器件 ３ｄｋ２１０型功率开关晶体管详细规范 |
China Electronics
Standards K2, |
English PDF |
| SJ 50033/12-1994 |
Discrete semiconductor devices Detailed specifications for 3DK209 power switching transistors 半导体分立器件 ３ｄｋ２０９型功率开关晶体管详细规范 |
China Electronics
Standards K2, |
English PDF |
| SJ 50033/11-1994 |
Discrete semiconductor devices Detailed specifications for 3DK208 power switching transistors 半导体分立器件 ３ｄｋ２０８型功率开关晶体管详细规范 |
China Electronics
Standards K2, |
English PDF |
| SJ 50033/10-1994 |
Discrete semiconductor devices Detailed specifications for 3DK207 power switching transistors 半导体分立器件 ３ｄｋ２０７型功率开关晶体管详细规范 |
China Electronics
Standards K2, |
English PDF |
| SJ 20211-1992 |
Detail specification Capacitors, fixed, mica dielectric, established reliability, type CYK2 ｃｙｋ２型有可靠性指标的云母固定电容器详细规范 |
China Electronics
Standards K2, |
English PDF |
| SJ 20174-1992 |
Semiconductor discrete device Detail specification for NPN silicon low-power swithing transistor of types 3DK2221, 3DK2221A, 3DK2222 and 3DK2222A 半导体分立器件 ３ｄｋ２２２１（２２２１ａ、２２２２、２２２２ａ）型ｎｐｎ硅小功率开关晶体管详细规范 |
China Electronics
Standards K2, |
English PDF |
| SJ 20173-1992 |
Semiconductor discrete device Detail specification for NPN silicon low-power swithing transistor of types 3DK2218, 3DK2218A, 3DK2219 and 3DK2219A 半导体分立器件 ３ｄｋ２２１８（２２１８ａ、２２１９、２２１９ａ）型ｎｐｎ硅小功率开关晶体管详细规范 |
China Electronics
Standards K2, |
English PDF |
| SJ 20084-1992 |
Capacitors, fixed, metallized polyethylene-terephthalate filmed dielectric d.c. in nonmetal cases, established reliability, CLK233 type, detail specification for 有可靠性指标的ｃｌｋ２３３型（非金属壳）金属化聚酯膜介质直流固定电容器详细规范 |
China Electronics
Standards K2, |
English PDF |
| SJ 20082-1992 |
Capacitors, fixed, metallized polypropylene filmed dielectric d.c. in nonmetal cases, established reliability, CBBK24 type detail specification for 有可靠性指标的ｃｂｂｋ２４型（非金属壳）金属化聚丙烯膜介质直流固定电容器详细规范 |
China Electronics
Standards K2, |
English PDF |
| SJ 20081-1992 |
Capacitors, fixed, double metallized polypropylene filmed dielectric d.c. in nonmetal cases, established reliability, CBBK23 type detail specification for 有可靠性指标的ｃｂｂｋ２３型（非金属壳）双面金属化聚丙烯膜介质直流固定电容器详细规范 |
China Electronics
Standards K2, |
English PDF |
| TB/T 1168-1991 |
(K1, K2, GK-type three-way valve technical conditions) k1 k2 gk型三通阀技术条件 |
China Railway & Train
Standards K2, |
English PDF |
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