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| Standard Code | Standard Title | Standard Class | Order |
|---|---|---|---|
| SJ/T 2658.16-2016 |
(The semiconductor infrared emitting diodes measuring methods - Part 16: photoelectric conversion efficiency) 半导体红外发射二极管测量方法 第16部分：光电转换效率 |
China Electronics
Standards Measuring method semiconductor |
 English PDF |
| SJ/T 2658.15-2016 |
(The semiconductor infrared emitting diodes measuring methods - Part 15: Thermal resistance) 半导体红外发射二极管测量方法 第15部分：热阻 |
China Electronics
Standards Measuring method semiconductor |
English PDF |
| SJ/T 2658.14-2016 |
(The semiconductor infrared emitting diodes measuring methods - Part 14: Junction Temperature) 半导体红外发射二极管测量方法 第14部分：结温 |
China Electronics
Standards Measuring method semiconductor |
English PDF |
| SJ/T 2658.9-2015 |
Measuring method for semiconductor infrared-emitting diode - Part 9: Spatial distribution of radiant intensity and half-intensity angle 半导体红外发射二极管测量方法 第9部分：辐射强度空间分布和半强度角 |
China Electronics
Standards Measuring method semiconductor |
English PDF |
| SJ/T 2658.8-2015 |
Measuring method for semiconductor infrared-emitting diode - Part 8: Radiant intensity 半导体红外发射二极管测量方法 第8部分：辐射强度 |
China Electronics
Standards Measuring method semiconductor |
English PDF |
| SJ/T 2658.7-2015 |
Measuring method for semiconductor infrared-emitting diode - Part 7: Radiant flux 半导体红外发射二极管测量方法 第7部分：辐射通量 |
China Electronics
Standards Measuring method semiconductor |
English PDF |
| SJ/T 2658.6-2015 |
Measuring method for semiconductor infrared-emitting diode - Part 6: Radiant power 半导体红外发射二极管测量方法 第6部分：辐射功率 |
China Electronics
Standards Measuring method semiconductor |
English PDF |
| SJ/T 2658.5-2015 |
Measuring method for semiconductor infrared-emitting diode - Part 5: Series connection resistance 半导体红外发射二极管测量方法 第5部分：串联电阻 |
China Electronics
Standards Measuring method semiconductor |
English PDF |
| SJ/T 2658.4-2015 |
Measuring method for semiconductor infrared-emitting diode - Part 4: Total capacitance 半导体红外发射二极管测量方法 第4部分：总电容 |
China Electronics
Standards Measuring method semiconductor |
English PDF |
| SJ/T 2658.3-2015 |
Measuring method for semiconductor infrared-emitting diode - Part 3: Reverse voltage and reverse current 半导体红外发射二极管测量方法 第3部分：反向电压和反向电流 |
China Electronics
Standards Measuring method semiconductor |
English PDF |
| SJ/T 2658.2-2015 |
Measuring method for semiconductor infrared-emitting diode - Part 2: Forward voltage 半导体红外发射二极管测量方法 第2部分：正向电压 |
China Electronics
Standards Measuring method semiconductor |
English PDF |
| SJ/T 2658.13-2015 |
Measuring method for semiconductor infrared-emitting diode - Part 13: Temperature coefficient for radiant power 半导体红外发射二极管测量方法 第13部分：辐射功率温度系数 |
China Electronics
Standards Measuring method semiconductor |
English PDF |
| SJ/T 2658.12-2015 |
Measuring method for semiconductor infrared-emitting diode - Part 12: Peak-emission wavelength and spectral radiant bandwidth 半导体红外发射二极管测量方法 第12部分：峰值发射波长和光谱辐射带宽 |
China Electronics
Standards Measuring method semiconductor |
English PDF |
| SJ/T 2658.1-2015 |
Measuring method for semiconductor infrared-emitting diode - Part 1: General 半导体红外发射二极管测量方法 第1部分：总则 |
China Electronics
Standards Measuring method semiconductor |
English PDF |
| SJ/T 2658.11-2015 |
Measuring method for semiconductor infrared-emitting diode - Part 11: Response time 半导体红外发射二极管测量方法 第11部分：响应时间 |
China Electronics
Standards Measuring method semiconductor |
English PDF |
| SJ/T 2658.10-2015 |
Measuring method for semiconductor infrared-emitting diode - Part 10: Modulation bandwidth 半导体红外发射二极管测量方法 第10部分：调制带宽 |
China Electronics
Standards Measuring method semiconductor |
English PDF |
| SJ/T 2215-2015 |
Measuring methods for semiconductor photocouplers 半导体光电耦合器测试方法 |
China Electronics
Standards Measuring method semiconductor |
English PDF |
| SJ/T 2214-2015 |
Measuring methods for semiconductor photodiode and phototransistor 半导体光电二极管和光电晶体管测试方法 |
China Electronics
Standards Measuring method semiconductor |
English PDF |
| YD/T 2001.2-2011 |
Semiconductor optoelectronic devices for fibre optic system applications. Part 2: measuring methods 用于光纤系统的半导体光电子器件 第2部分：测试方法 |
China Telecommunication
Standards Measuring method semiconductor |
English PDF |
| SJ/T 11405-2009 |
Semiconductor optoelectronic devices for fibre optic system applications. Part 2: Measuring methods 光纤系统用半导体光电子器件 第2部分：测量方法 |
China Electronics
Standards Measuring method semiconductor |
English PDF |
| SJ/T 10805-2000 |
Semiconductor interface integrated circuits General principles of measuring methods for voltage comparators 半导体集成电路电压比较器测试方法的基本原理 |
China Electronics
Standards Measuring method semiconductor |
English PDF |
| SJ 20026-1992 |
Measuring methods for gas sensors of metal-oxide semiconductor 金属氧化物半导体气敏件测试方法 |
China Electronics
Standards Measuring method semiconductor |
English PDF |
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