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| Standard Code | Standard Title | Standard Class | Order |
|---|---|---|---|
| SJ 20789-2000 |
Rapid screening test methods for Thermal sensitive parameter of MOS field effect transistor mos场效应晶体管热敏参数快速筛选试验方法 |
China Electronics
Standards Rapid screening test |
 English PDF |
| JJG(SJ)04052-1995 |
(PTQ-2-type transistor rapid screening instrument test procedures) |
China Metrological
Standards Rapid screening test |
English PDF |
| JJG(SJ)04051-1995 |
(PDW-1 regulator diode test procedures for rapid screening instrument) |
China Metrological
Standards Rapid screening test |
English PDF |
| JJG(SJ)04050-1995 |
(PCT-2-diode test procedures for rapid screening instrument) |
China Metrological
Standards Rapid screening test |
English PDF |
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