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| Standard Code | Standard Title | Standard Class | Order |
|---|---|---|---|
| SJ 20844-2002 |
Test method for microzone homogeneity of semi-insulating monocrystal gallium arsenide 决绝缘砷化镓单晶微区均匀性测试方法 |
China Electronics
Standards Test method microzone |
 English PDF |
| SJ 20636-1997 |
Test method for oxygen and carbon contents of large diameter thin silicon wafer in microzone for use in IC ic用大直径薄硅片的氧、碳含量微区试验方法 |
China Electronics
Standards Test method microzone |
English PDF |
| SJ 20635-1997 |
Test method for residual impurities concentration in microzone of semi-insulating gallium arsenide 半绝缘砷化镓剩余杂质浓度微区试验方法 |
China Electronics
Standards Test method microzone |
English PDF |
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