China memory GB Standards English PDF List

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China "memory" GB Standards English PDF List:

Standard Code	Standard Title	Standard Class	Order
GB/T 44046-2024	Non-destructive testing-Metal magnetic memory-Weld joint detection 无损检测-金属磁记忆-焊接接头检测	China National Standards memory	English PDF
GB/T 24627-2023	Nickel-titanium shape memory alloy processing materials for surgical implants 外科植入物用镍-钛形状记忆合金加工材	China National Standards memory	English PDF
GB/T 42974-2023	Semiconductor integrated circuit flash memory (FLASH) 半导体集成电路快闪存储器（FLASH）	China National Standards memory	English PDF
GB/T 12604.10-2023	Non-destructive testing - Terminology - Part 10: Magnetic memory testing 无损检测术语第10部分：磁记忆检测	China National Standards memory	English PDF
GB/T 42516-2023	Chemical analysis method of high temperature shape memory alloy - determination of platinum content - thiourea complex precipitation method 高温形状记忆合金化学分析方法铂含量的测定硫脲络合沉淀法	China National Standards memory	English PDF
GB/T 41420-2022	Testing and evaluation of shape memory properties of textiles 纺织品形状记忆性能检测和评价	China National Standards memory	English PDF
GB/T 39989-2021	Superelastic titanium-nickel shape memory alloy bar and wire 超弹性钛镍形状记忆合金棒材和丝材	China National Standards memory	English PDF
GB/T 39985-2021	Titanium-nickel shape memory alloy plate 钛镍形状记忆合金板材	China National Standards memory	English PDF
GB/T 26641-2021	Non-destructive testing—Magnetic memory testing—General requirements 无损检测磁记忆检测总体要求	China National Standards memory	English PDF
GB/T 35660.3-2021	Information and documentation—RFID in libraries—Part 3:Encoding of data elements based on rules from ISO/IEC 15962 in an RFID tag with partitioned memory 信息与文献图书馆射频识别（RFID）第3部分：分区存储RFID标签中基于ISO/IEC 15962规则的数据元素编码	China National Standards memory	English PDF
GB/T 34370.10-2020	Nondestructive testing of amusement equipments—Part 10: Magnetic memory testing 游乐设施无损检测第10部分：磁记忆检测	China National Standards memory	English PDF
GB/T 36474-2018	Semiconductor integrated circuit—Measuring methods for double data rate 3 synchronous dynamic random access memory(DDR3 SDRAM) 半导体集成电路第三代双倍数据速率同步动态随机存储器 (DDR3 SDRAM)测试方法	China National Standards memory	English PDF
GB/T 36477-2018	Semiconductor integrated circuit—Measuring methods for flash memory 半导体集成电路快闪存储器测试方法	China National Standards memory	English PDF
GB/T 36614-2018	Integrated circuits—memory devices pin configuration 集成电路存储器引出端排列	China National Standards memory	English PDF
GB/T 35003-2018	Test methods for endurance and data retention of non-volatile memory 非易失性存储器耐久和数据保持试验方法	China National Standards memory	English PDF
GB/T 33657-2017	Nanotechnologies—Electrical operating parameter test specification of wafer level nano-scale phase change memory cells 纳米技术晶圆级纳米尺度相变存储单元电学操作参数测试规范	China National Standards memory	English PDF
GB/T 26641-2011	Non-destructive testing - Magnetic memory testing - General principles 无损检测磁记忆检测总则	China National Standards memory	English PDF
GB/T 12604.10-2011	Non-destructive testing - Terminology - Terms used in magnetic memory testing 无损检测术语磁记忆检测	China National Standards memory	English PDF
GB 24627-2009	Standard specification for wrought nickel-titanium shape memory alloys for medical devices and surgical implants 医疗器械和外科植入物用镍-钛形状记忆合金加工材	China National Standards memory	English PDF
GB/T 23614.2-2009	Chemical analysis methods for titanium nickel shape memory alloy - Part 2: Determination of cobalt, copper, chromium, iron, niobium content - Inductively coupled plasma atomic emission spectrometry 钛镍形状记忆合金化学分析方法第2部分：钴、铜、铬、铁、铌量的测定电感耦合等离子体发射光谱法	China National Standards memory	English PDF
GB/T 23614.1-2009	Methods for chemical analysis of titanium nickel shape memory alloy - Part 1: Determination of nickel content - Dimethylglyoxime precipitate separatioin－EDTA complex-zinc chloride back titration 钛镍形状记忆合金化学分析方法第1部分：镍量的测定丁二酮肟沉淀分离－EDTA络合-氯化锌返滴定法	China National Standards memory	English PDF
GB/T 17574.11-2006	Semiconductor devices - Integrated circuits - Part 2-11: Digital integrated circuits - Blank detail specification for single supply integrated circuit electrically erasable and programmable read-only memory 半导体器件集成电路第2-11部分：数字集成电路单电源集成电路电可擦可编程只读存储器空白详细规范	China National Standards memory	English PDF
GB/T 17550.4-2000	Identification cards--Optical memory cards--Linear recording method--Part 4:Logical data structures 识别卡光记忆卡线性记录方法第4部分:逻辑数据结构	China National Standards memory	English PDF
GB/T 17825.10-1999	Management of CAD documents--memory and maintenance CAD文件管理存储与维护	China National Standards memory	English PDF
GB/T 17551-1998	Identification cards--Optical memory cards--General characteristics 识别卡光记忆卡一般特性	China National Standards memory	English PDF
GB/T 17550.3-1998	Identification cards--Optical memory cards--Linear recording method--Part 3:Optical properties and characteristics 识别卡光记忆卡线性记录方法第3部分:光属性和特性	China National Standards memory	English PDF
GB/T 17550.2-1998	Identification cards--Optical memory cards--Linear recording method--Part 2:Dimensions and location of the accessible optical area 识别卡光记忆卡线性记录方法第2部分:可访问光区域的尺寸和位置	China National Standards memory	English PDF
GB/T 17550.1-1998	Identification cards--Optical memory cards--Linear recording method--Part 1:Physical characteristics 识别卡光记忆卡线性记录方法第1部分:物理特性	China National Standards memory	English PDF

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