China 'GB/T 26070-2010
' standard english version:
NATIONAL STANDARD OF THE PEOPLE'S REPUBLIC OF CHINA
GB/T 26070-2010
Characterization of subsurface damage in polished compound semiconductor wafers by reflectance difference spectroscopy method 化合物半导体抛光晶片亚表面损伤的反射差分谱测试方法
Issued Date:2011-01-10
Implemented Date:2011-10-01
Issued by:
The Standardization Administration of the People's Republic of China