GB/T 26068-2010
China national
standard english version:
GB
中华人民共和国国家标准
NATIONAL
STANDARD OF THE PEOPLE'S REPUBLIC OF CHINA
GB/T 26068-2010
Test method for carrier recombination lifetime in silicon wafers by non-contact measurement of photoconductivity decay by microwave reflectance 硅片载流子复合寿命的无接触微波反射光电导衰减测试方法
Issued Date:2011-01-10
Implemented Date:2011-10-01
Issued by:
The Standardization Administration of the People's Republic of China