China 'GB/T 24582-2009
' standard english version:
NATIONAL STANDARD OF THE PEOPLE'S REPUBLIC OF CHINA
GB/T 24582-2009
Test method for measuring surface metal contamination of polycrystalline silicon by acid extraction-inductively coupled plasma mass spectrometry 酸浸取 电感耦合等离子质谱仪测定多晶硅表面金属杂质
Issued Date:2009-10-30
Implemented Date:2010-06-01
Issued by:
The Standardization Administration of the People's Republic of China