China 'GB/T 29507-2013
' standard english version:
NATIONAL STANDARD OF THE PEOPLE'S REPUBLIC OF CHINA
GB/T 29507-2013
Test method for measuring flatness, thickness and total thickness variation on silicon wafers by automated non-contact scanning 硅片平整度、厚度及总厚度变化测试 自动非接触扫描法
Issued Date:2013-05-09
Implemented Date:2014-02-01
Issued by:
The Standardization Administration of the People's Republic of China