NATIONAL STANDARD OF THE PEOPLE'S REPUBLIC OF CHINA
GB/T 6616-2009
Test methods for measuring resistivity of semiconductor wafers or sheet resistance of semiconductor films with a noncontact eddy-current gauge 半导体硅片电阻率及硅薄膜薄层电阻测试方法 非接触涡流法
Issued Date:2009-10-30
Implemented Date:2010-06-01
Issued by:
The Standardization Administration of the People's Republic of China